{"id":34869,"date":"2022-11-12T06:00:37","date_gmt":"2022-11-12T06:00:37","guid":{"rendered":"https:\/\/dev.consapsg.com\/?p=34869"},"modified":"2026-07-28T08:49:08","modified_gmt":"2026-07-28T08:49:08","slug":"atomic-force-microscopy-afm","status":"publish","type":"post","link":"https:\/\/cde.nus.edu.sg\/e6nanofab\/atomic-force-microscopy-afm\/","title":{"rendered":"Atomic Force\/Scanning Probe Microscopy – Park NX20"},"content":{"rendered":"\t\t
\n\t\t\t\t\t\t
\n\t\t\t\t\t\t
\n\t\t\t\t\t
\n\t\t\t
\n\t\t\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
\n\t\t\t\t\t\t
\n\t\t\t\t\t
\n\t\t\t
\n\t\t\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t
\n\t\t\t
<\/div>\n\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t
\n\t\t\t\t\t\t
\n\t\t\t\t\t
\n\t\t\t
\n\t\t\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t

ATOMIC FORCE\/ SCANNING PROBE MICROSCOPY PARK NX20 - AFM<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t
\n\t\t\t\n\t\t\t\t\t\t<\/span>\n\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t
\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t

System Overview<\/strong><\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t

\n\t\t\t\t
\n\t\t\t\t\t\t\t\t\t

The Park NX20 AFM features the world\u2019s only True Non-Contact\u2122 mode, allowing users to take both repeated measurements without damaging sample surface while preserving tip sharpness. Reputed as the world\u2019s most accurate large sample AFM, The Park NX20 is a leading nano metrology tool for failure analysis and large sample research.<\/p>

Technical Specifications<\/strong><\/p>

\"\"<\/strong><\/p>

  • Large sample measurement of up to 300 mm.<\/li>
  • Park SmartScan\u2122 \u2013 powerful operating software automates processes which drastically improve efficiency and guides user through every step of the imaging process.<\/li><\/ul>

    Incorporated Scanning Modes<\/strong><\/p>

    • True Non-Contact\u2122 mode<\/li>
    • Dynamic contact mode<\/li>
    • Contact mode<\/li>
    • Magnetic Force Microscopy (MFM)<\/li>
    • Phase Imaging<\/li>
    • Lateral Force Microscopy (LFM)<\/li>
    • Force-Distance (F\/D) Spectroscopy<\/li>
    • Force volume Imaging<\/li>
    • Electricstatic Force Microscopy (EFM)<\/li>
    • Piezoresponse Force Microscopy (PFM)<\/li>
    • Scanning Kelvin Probe Microscopy (SKPM)<\/li>
    • Force Modulation Microscopy (FMM)<\/li>
    • Nanoindentation<\/li>
    • Nanolithography<\/li>
    • Variable Enhanced Conductive AFM (VECA)<\/li>
    • Scanning Capacitance Microscopy (SCM)<\/li><\/ul>

      AFM, MFM, CAFM, SCM<\/p>

      Location:\u00a0<\/strong>E6-01-02, Class 100 Cleanroom<\/p>

      Contact:<\/strong>\u00a0e6nanofab@nus.edu.sg<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"

       <\/p>\n","protected":false},"author":4,"featured_media":28957,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"single-fullwidth.php","format":"standard","meta":{"footnotes":""},"categories":[57,50,66],"tags":[],"class_list":["post-34869","post","type-post","status-publish","format-standard","has-post-thumbnail","category-characterisation-and-metrology","category-l1-cr","category-material-characterization-and-process-control"],"menu_order":6,"_links":{"self":[{"href":"https:\/\/cde.nus.edu.sg\/e6nanofab\/wp-json\/wp\/v2\/posts\/34869","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/cde.nus.edu.sg\/e6nanofab\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/cde.nus.edu.sg\/e6nanofab\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/cde.nus.edu.sg\/e6nanofab\/wp-json\/wp\/v2\/users\/4"}],"replies":[{"embeddable":true,"href":"https:\/\/cde.nus.edu.sg\/e6nanofab\/wp-json\/wp\/v2\/comments?post=34869"}],"version-history":[{"count":42,"href":"https:\/\/cde.nus.edu.sg\/e6nanofab\/wp-json\/wp\/v2\/posts\/34869\/revisions"}],"predecessor-version":[{"id":42669,"href":"https:\/\/cde.nus.edu.sg\/e6nanofab\/wp-json\/wp\/v2\/posts\/34869\/revisions\/42669"}],"wp:attachment":[{"href":"https:\/\/cde.nus.edu.sg\/e6nanofab\/wp-json\/wp\/v2\/media?parent=34869"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/cde.nus.edu.sg\/e6nanofab\/wp-json\/wp\/v2\/categories?post=34869"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/cde.nus.edu.sg\/e6nanofab\/wp-json\/wp\/v2\/tags?post=34869"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}