{"id":35253,"date":"2022-11-24T02:08:32","date_gmt":"2022-11-24T02:08:32","guid":{"rendered":"https:\/\/dev.consapsg.com\/?p=35253"},"modified":"2026-07-30T07:31:45","modified_gmt":"2026-07-30T07:31:45","slug":"spm","status":"publish","type":"post","link":"https:\/\/cde.nus.edu.sg\/e6nanofab\/spm\/","title":{"rendered":"Surface Profiler &#8211; Bruker DektakXT"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-post\" data-elementor-id=\"35253\" class=\"elementor elementor-35253\" data-elementor-post-type=\"post\">\n\t\t\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-4e5585a elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"4e5585a\" data-element_type=\"section\" data-e-type=\"section\" data-settings=\"{&quot;background_background&quot;:&quot;classic&quot;}\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-dfcc2a4\" data-id=\"dfcc2a4\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap\">\n\t\t\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-cbec0c9 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"cbec0c9\" data-element_type=\"section\" data-e-type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-cc1f494\" data-id=\"cc1f494\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap\">\n\t\t\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<section class=\"elementor-section elementor-top-section elementor-element elementor-element-9278c58 elementor-section-boxed elementor-section-height-default elementor-section-height-default\" data-id=\"9278c58\" data-element_type=\"section\" data-e-type=\"section\">\n\t\t\t\t\t\t<div class=\"elementor-container elementor-column-gap-default\">\n\t\t\t\t\t<div class=\"elementor-column elementor-col-100 elementor-top-column elementor-element elementor-element-a491651\" data-id=\"a491651\" data-element_type=\"column\" data-e-type=\"column\">\n\t\t\t<div class=\"elementor-widget-wrap elementor-element-populated\">\n\t\t\t\t\t\t<div class=\"elementor-element elementor-element-90af465 elementor-widget elementor-widget-spacer\" data-id=\"90af465\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"spacer.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t<div class=\"elementor-spacer\">\n\t\t\t<div class=\"elementor-spacer-inner\"><\/div>\n\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-af5745b elementor-widget elementor-widget-heading\" data-id=\"af5745b\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"heading.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t<h2 class=\"elementor-heading-title elementor-size-default\">Surface Profiler - Bruker DektakXT<\/h2>\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-30abd27 elementor-widget-divider--view-line elementor-widget elementor-widget-divider\" data-id=\"30abd27\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"divider.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t<div class=\"elementor-divider\">\n\t\t\t<span class=\"elementor-divider-separator\">\n\t\t\t\t\t\t<\/span>\n\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-d5d72ff elementor-widget elementor-widget-spacer\" data-id=\"d5d72ff\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"spacer.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t<div class=\"elementor-spacer\">\n\t\t\t<div class=\"elementor-spacer-inner\"><\/div>\n\t\t<\/div>\n\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<div class=\"elementor-element elementor-element-7ffaaa6 elementor-widget elementor-widget-text-editor\" data-id=\"7ffaaa6\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><b>System Overview<\/b><\/p><p>The Bruker Dimension Icon AFM incorporates the latest evolution of Bruker\u2019s industry-leading nanoscale imaging and characterization technologies on a large sample tip-scanning AFM platform. The Icon\u2019s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y.<br \/><br \/><\/p><p><img fetchpriority=\"high\" decoding=\"async\" class=\"wp-image-28973 alignleft\" src=\"http:\/\/e6nanofab.nus.edu.sg\/wp-content\/uploads\/2019\/05\/L5-Characterization_Bruker_SPM_E6-05-08A-300x225.jpg\" sizes=\"(max-width: 300px) 100vw, 300px\" srcset=\"https:\/\/e6nanofab.nus.edu.sg\/wp-content\/uploads\/2019\/05\/L5-Characterization_Bruker_SPM_E6-05-08A-300x225.jpg 300w, https:\/\/e6nanofab.nus.edu.sg\/wp-content\/uploads\/2019\/05\/L5-Characterization_Bruker_SPM_E6-05-08A.jpg 720w\" alt=\"\" width=\"411\" height=\"310\" \/><\/p><p><strong><br \/><br \/><\/strong><\/p><p><strong>\u00a0<\/strong><\/p><p><strong>\u00a0<\/strong><\/p><p><strong>\u00a0<\/strong><\/p><p><strong>\u00a0<\/strong><\/p><p><strong>\u00a0<\/strong><\/p><p><strong>\u00a0<\/strong><\/p><p><strong>Technical Specifications<\/strong><\/p><ul><li>ScanAsyst\u00ae Imaging \u2013 ScanAsyst is a\u00a0PeakForce Tapping\u00a0based image optimization technique that enables every user to create the highest resolution AFM images using single-touch scanning.<\/li><li>Conventional Tapping Mode \u2013 for topology\/roughness\/step-height measurements<\/li><li>Magnetic Force Microscopy (MFM) \u2013 can be used to image both naturally occurring and deliberately written domain structures in magnetic materials.<\/li><li>Electric Force Microscopy (EFM) \u2013 is used for electrical failure analysis, detecting trapped charges, mapping electric polarization, and performing electrical read\/write, among other applications.<\/li><li>Kelvin Probe Force Microscopy (KPFM) \u2013 is widely used for analysing the surface potential of the structures.<\/li><li>Conductive AFM (CAFM) \u2013 used to measure and map current of the sample in the 2pA to 1\u00b5A range while simultaneously collecting topographic information.<\/li><\/ul><p><strong><br \/><br \/>Location:\u00a0<\/strong>E6-05-08A, Characterization Room<\/p><p><strong>Contact:<\/strong>\u00a0e6nanofab@nus.edu.sg<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t<\/section>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>&nbsp;<\/p>\n","protected":false},"author":5,"featured_media":28973,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"single-fullwidth.php","format":"standard","meta":{"footnotes":""},"categories":[69,57,67],"tags":[],"class_list":["post-35253","post","type-post","status-publish","format-standard","has-post-thumbnail","category-characterisation","category-characterisation-and-metrology","category-metrology"],"menu_order":0,"_links":{"self":[{"href":"https:\/\/cde.nus.edu.sg\/e6nanofab\/wp-json\/wp\/v2\/posts\/35253","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/cde.nus.edu.sg\/e6nanofab\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/cde.nus.edu.sg\/e6nanofab\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/cde.nus.edu.sg\/e6nanofab\/wp-json\/wp\/v2\/users\/5"}],"replies":[{"embeddable":true,"href":"https:\/\/cde.nus.edu.sg\/e6nanofab\/wp-json\/wp\/v2\/comments?post=35253"}],"version-history":[{"count":29,"href":"https:\/\/cde.nus.edu.sg\/e6nanofab\/wp-json\/wp\/v2\/posts\/35253\/revisions"}],"predecessor-version":[{"id":42770,"href":"https:\/\/cde.nus.edu.sg\/e6nanofab\/wp-json\/wp\/v2\/posts\/35253\/revisions\/42770"}],"wp:attachment":[{"href":"https:\/\/cde.nus.edu.sg\/e6nanofab\/wp-json\/wp\/v2\/media?parent=35253"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/cde.nus.edu.sg\/e6nanofab\/wp-json\/wp\/v2\/categories?post=35253"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/cde.nus.edu.sg\/e6nanofab\/wp-json\/wp\/v2\/tags?post=35253"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}