{"id":16315,"date":"2023-10-08T11:32:50","date_gmt":"2023-10-08T03:32:50","guid":{"rendered":"https:\/\/cde.nus.edu.sg\/emf\/?page_id=16315"},"modified":"2025-08-31T16:17:21","modified_gmt":"2025-08-31T08:17:21","slug":"stem","status":"publish","type":"page","link":"https:\/\/cde.nus.edu.sg\/emf\/stem\/","title":{"rendered":"S\/TEM Cluster"},"content":{"rendered":"\n<h2>\n\t\tTransmission Electron Microscopes\n\t<\/h2>\n\t<h3>Aberration-corrected Analytical S\/TEM<\/h3>\n<p><strong>JEOL JEM-ARM200F<\/strong><\/p>\nThe JEM-ARM200F is a 200kV cold field-emission, probe-corrected transmission electron microscope with a STEM resolution of 0.078 nm and TEM resolution of 0.1 nm. It also has an energy-dispersive X-ray detector and dual energy loss spectrometers that can form elemental maps at atomic resolution, and a fast CMOS camera. With its probe aberration corrector and ultra-high-resolution pole-piece it is particularly suited to STEM imaging and analysis.\n\t<ul>\n<li>Cold field-emission gun<\/li>\n<li>CEOS ASCOR aberration corrector<\/li>\n<li>UHR pole piece<\/li>\n<li>Spatial resolution: 78 pm (STEM)<\/li>\n<li>Energy resolution: 0.3 eV<\/li>\n<\/ul>\n\t<h3>High-throughput Analytical S\/TEM<\/h3>\n<p><strong>JEOL JEM-2800<\/strong><\/p>\nThe JEM-2800 is an advanced workhorse 200 kV transmission electron microscope with a Schottky-type field emission electron source. This multi-purpose S\/TEM employs an user-friendly, high-stability operating system for high-resolution imaging in TEM (including diffraction modes) and STEM (imaging and EDS). Equipped with a TMP vacuum system, the JEM-2800 is particularly suited for fast screening of multiple samples.\n\t<ul>\n<li>Schottky-type electron gun<\/li>\n<li>Highly stable eucentric side-entry goniometer stage<\/li>\n<li>TMP vacuum system<\/li>\n<li>Spatial resolution: 0.1 nm (TEM), 0.2 nm (STEM)<\/li>\n<\/ul>\n\t<h3>High-resolution Analytical TEM<\/h3>\n<p><strong>JEOL 2010F<\/strong><\/p>\nThe JEOL 2010F TEM provides both conventional and high resolution TEM imaging using a Field Emission tip. It is equipped with single tilt, double-tilt, and multi-sample holders for fast screening of samples.\n\t<ul>\n<li>Cold field-emission gun<\/li>\n<li>Spatial Resolution: 0.19\u00a0nm (HRTEM)<\/li>\n<\/ul>\n\t<h3>Educational TEM<\/h3>\n<p><strong>JEOL 3010<\/strong><\/p>\nThe JEOL 3010 is a 300kV transmission electron microscope with a LaB<sub>6<\/sub> electron source. Being capable of high-resolution, micro-area analysis, electron diffraction, and convergent beam electron diffraction techniques, this system has been adapted for educational purposes.\n\t<ul>\n<li>Cold field-emission gun<\/li>\n<li>Spatial Resolution: 0.17 nm (HRTEM)<\/li>\n<\/ul>\n\n","protected":false},"excerpt":{"rendered":"<p>Transmission Electron Microscopes Aberration-corrected Analytical S\/TEM JEOL JEM-ARM200F The JEM-ARM200F is a 200kV cold field-emission, probe-corrected transmission electron microscope with a STEM resolution of 0.078 nm and TEM resolution of 0.1 nm. It also has an energy-dispersive X-ray detector and dual energy loss spectrometers that can form elemental maps at atomic resolution, and a fast [&hellip;]<\/p>\n","protected":false},"author":289,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"site-sidebar-layout":"no-sidebar","site-content-layout":"page-builder","ast-site-content-layout":"full-width-container","site-content-style":"unboxed","site-sidebar-style":"unboxed","ast-global-header-display":"","ast-banner-title-visibility":"","ast-main-header-display":"","ast-hfb-above-header-display":"","ast-hfb-below-header-display":"","ast-hfb-mobile-header-display":"","site-post-title":"disabled","ast-breadcrumbs-content":"","ast-featured-img":"disabled","footer-sml-layout":"","theme-transparent-header-meta":"default","adv-header-id-meta":"","stick-header-meta":"","header-above-stick-meta":"","header-main-stick-meta":"","header-below-stick-meta":"","astra-migrate-meta-layouts":"set","ast-page-background-enabled":"default","ast-page-background-meta":{"desktop":{"background-color":"var(--ast-global-color-4)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-gradient":""},"tablet":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-gradient":""},"mobile":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-gradient":""}},"ast-content-background-meta":{"desktop":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-gradient":""},"tablet":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-gradient":""},"mobile":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-gradient":""}},"footnotes":""},"class_list":["post-16315","page","type-page","status-publish","hentry"],"acf":[],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v21.7 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>S\/TEM Cluster - EMF<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/cde.nus.edu.sg\/emf\/stem\/\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"S\/TEM Cluster - EMF\" \/>\n<meta property=\"og:description\" content=\"Transmission Electron Microscopes Aberration-corrected Analytical S\/TEM JEOL JEM-ARM200F The JEM-ARM200F is a 200kV cold field-emission, probe-corrected transmission electron microscope with a STEM resolution of 0.078 nm and TEM resolution of 0.1 nm. 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