{"id":16506,"date":"2024-04-16T19:55:17","date_gmt":"2024-04-16T11:55:17","guid":{"rendered":"https:\/\/cde.nus.edu.sg\/mse\/?page_id=16506"},"modified":"2024-09-18T18:07:07","modified_gmt":"2024-09-18T10:07:07","slug":"t11-structural-characterisation","status":"publish","type":"page","link":"https:\/\/cde.nus.edu.sg\/mse\/t11-structural-characterisation\/","title":{"rendered":"T11 Structural Characterisation"},"content":{"rendered":"\n<h1>\n\t\tStructural Characterisation\n\t<\/h1>\n\t<p><strong>Providing a wide range of tool, training and expertise for Topographic imaging structural characterisation of nanoscale materials.<\/strong><\/p>\n<p><strong>Structural Charactierisation Facilities<\/strong><\/p>\n<p>The facility is well equipped with various state-of-art facilities for Nano-Fabrication, Topographic imaging and structural characterization such as Helium Ion Microscope (Orion Nano-Fab), AFM\/SPM, Raman spectrometer, Direct laser writer, mask aligner etc. The various facilities are supported by postdoctoral fellows and PhD students who are superusers for specific equipments and manage the facility along with their research work. These include:<\/p>\n<ul>\n<li>High resolution helium ion microscope is equipped with SE2 detector, charge neutralizer and plasma cleaner to handle a broad range of specimens.<\/li>\n<li>The focused helium ion beam with sub-nm probe size enables users to write sub-10nm structures by direct milling.<\/li>\n<li>The Neon ion beam is used to create the desired patterns by fast milling.<\/li>\n<li>The electron flood gun enables to image insulating samples without any conductive coating which is very essential for biological\/insulating specimens.<\/li>\n<li>Direct laser writer along with Orion Nano-Fab enables to cutting-edging device fabrications.<\/li>\n<\/ul>\n<p>The labs for respective equipments are well designed to avoid any external disturbances such as acoustics, vibration, air flow, temperature, light etc. room\/low temperature Raman along with PL enables us to probe structural fingerprints of the specimens:<\/p>\n<section data-id=\"a0adb6b\" data-element_type=\"section\" data-settings=\"{&quot;stretch_section&quot;:&quot;section-stretched&quot;}\">\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<\/section>\n\t\t\t\t\t\t<h5>How to Access Facilities<\/h5>\n\t\t\t<p>To access the facility, the following steps must be followed: <\/p>\n<p>Contact Ngee Hong Teo (mtnh@nus.edu.sg) and Tiho (tiho@nus.edu.sg) to schedule a project meeting.<\/p>\n<p>Register your personal and project details with PPMS (<a href=\"https:\/\/ppms.asia\/nus-cde\/login\/\">https:\/\/ppms.asia\/nus-cde\/login\/<\/a>)<\/p>\n<p>Schedule a training or service session with our staff.<\/p>\n\t\t\t\t\t\t<h5>Service &amp; Booking Fees<\/h5>\n\t\t\t<p>Booking fees will differ for NUS and Non-NUS members. More details will be published soon.\u00a0<\/p>\n\t\t\t\t\t\t<h5>Our Partners<\/h5>\n\t\t\t<p>Find out more about our partners in Singapore:<\/p>\n<p><a href=\"https:\/\/cde.nus.edu.sg\/emf\">Electron Microscopy Facility (EMF)<\/a><\/p>\n<p><a href=\"https:\/\/www.singascope.sg\/\">SingaScope<\/a><\/p>\n<p><a href=\"https:\/\/www.dbs.nus.edu.sg\/cbis\/\">NUS Center for Bioimaging Sciences (CBIS)<\/a><\/p>\n<p><a href=\"https:\/\/medicine.nus.edu.sg\/core-facilities\/electron-microscopy-unit-emu\/\">NUS YLL School of Medicine Electron Microscopy Unit (EMU)<\/a><\/p>\n<p><a href=\"https:\/\/www.ntu.edu.sg\/facts\">NTU Facility for Analysis, Characterization, Testing and Simulation (FACTS)<\/a><\/p>\n<p><a href=\"https:\/\/www.a-star.edu.sg\/imre\/research-departments\/advanced-characterization-and-instrumentation\">A*STAR IMRE Advanced Characterization and Instrumentation (ACI) Department<\/a><\/p>\n\t<h1>Contact Us<\/h1>\n\t<strong>Research Fellow : <\/strong>Tiho@nus.edu.sg<br \/>\n<strong>Lab Technologist : <\/strong>Mtnh@nus.edu.sg<br \/>\n<strong>Communications : <\/strong>Samuel@nus.edu.sg\nT11 Shared Facilities<br \/>\nLevel 11<br \/>\nT-Lab Building<br \/>\n5A Engineering Drive 1<br \/>\nCollege of Design and Engineering<br \/>\nSingapore 117411\n\t\n<h1>\n\t\tFACILITIES\n\t<\/h1>\n\t<h3>Click on the icon\/tab to learn more about our facilities at NUS T11:<\/h3>\n\t<ul data-height=\"150\" data-width=\"150\" data-shape=\"square\">\n\t\t\t\t\t\t\t\t\t\t<li>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<a target=\"_blank\" rel=\"noopener\" href=\"https:\/\/cde.nus.edu.sg\/mse\/t11-material-synthesis\">\n\t\t\t\t\t\t\t\t\t\t\t<img decoding=\"async\" src=\"https:\/\/cde.nus.edu.sg\/mse\/wp-content\/uploads\/sites\/4\/2024\/04\/icon_01.png\" alt=\"\" \/>\t\t\t\t\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/a>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/li>\n\t\t\t\t\t\t\t\t\t\t\t\t\t<\/ul>\n\t<ul data-height=\"150\" data-width=\"150\" data-shape=\"square\">\n\t\t\t\t\t\t\t\t\t\t<li>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<a target=\"_blank\" rel=\"noopener\" href=\"https:\/\/cde.nus.edu.sg\/mse\/t11-structural-characterisation\">\n\t\t\t\t\t\t\t\t\t\t\t<img decoding=\"async\" src=\"https:\/\/cde.nus.edu.sg\/mse\/wp-content\/uploads\/sites\/4\/2024\/04\/icon_02.png\" alt=\"\" \/>\t\t\t\t\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/a>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/li>\n\t\t\t\t\t\t\t\t\t\t\t\t\t<\/ul>\n\t<ul data-height=\"150\" data-width=\"150\" data-shape=\"square\">\n\t\t\t\t\t\t\t\t\t\t<li>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<a target=\"_blank\" rel=\"noopener\" href=\"https:\/\/cde.nus.edu.sg\/mse\/t11-properties\">\n\t\t\t\t\t\t\t\t\t\t\t<img decoding=\"async\" src=\"https:\/\/cde.nus.edu.sg\/mse\/wp-content\/uploads\/sites\/4\/2024\/04\/icon_03.png\" alt=\"\" \/>\t\t\t\t\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/a>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/li>\n\t\t\t\t\t\t\t\t\t\t\t\t\t<\/ul>\n\t<ul data-height=\"150\" data-width=\"150\" data-shape=\"square\">\n\t\t\t\t\t\t\t\t\t\t<li>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<a target=\"_blank\" rel=\"noopener\" href=\"https:\/\/cde.nus.edu.sg\/mse\/t11-devices\">\n\t\t\t\t\t\t\t\t\t\t\t<img decoding=\"async\" src=\"https:\/\/cde.nus.edu.sg\/mse\/wp-content\/uploads\/sites\/4\/2024\/04\/icon_04.png\" alt=\"\" \/>\t\t\t\t\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/a>\n\t\t\t\t\t\t\t\t\t\t\t\t\t\t<\/li>\n\t\t\t\t\t\t\t\t\t\t\t\t\t<\/ul>\n<h1>\n\t\tMaterial synthesis\n\t<\/h1>\n<h2>\n\t\tStructural Characterisation\n\t<\/h2>\n<h2>\n\t\tProperties\n\t<\/h2>\n<h2>\n\t\tDevices\n\t<\/h2>\n<h1>\n\t\tStructural Characterisation Facilities\n\t<\/h1>\n\t\t<nav>\n\t\t\t<ul>\n\t\t\t\t\t\t\t\t<li data-index=\"0\">\n\t\t\t\t\t<h5>\n\t\t\t\t\t\t<a href=\"void(0);\">Structural Characterization Tools\n\t\t\t\t\t\t\t\t\t\t\t\t<\/a>\n\t\t\t\t\t<\/h5>\n\t\t\t\t<\/li>\n\t\t\t\t\t\t\t\t<li data-index=\"1\">\n\t\t\t\t\t<h5>\n\t\t\t\t\t\t<a href=\"void(0);\">Structural Characterization\/Morphology\n\t\t\t\t\t\t\t\t\t\t\t\t<\/a>\n\t\t\t\t\t<\/h5>\n\t\t\t\t<\/li>\n\t\t\t\t\t\t\t<\/ul>\n\t\t<\/nav>\n\t\t\t\t\t<h5>\n\t\t\t\t\t\t\t\t\t\t\t\tStructural Characterization Tools\n\t\t\t\t\t\t\t\t\t\t\t<\/h5>\n\t\t\t\t\t<p><strong>Discover more, Click <a href=\"#tools\">here.<\/a><\/strong><\/p>\n<p>The following are available at our facility: Helium Ion Microscope (HIM), BRUKER XRD, Raman Spectrometer. <\/p>\n\t\t\t\t\t<h5>\n\t\t\t\t\t\t\t\t\t\t\t\tStructural Characterization\/Morphology\n\t\t\t\t\t\t\t\t\t\t\t<\/h5>\n\t\t\t\t\t<p><strong>Discover more, Click <a href=\"#morphology\">here.<\/a><\/strong><\/p>\n<p>The facilities consist of Surface Stylus Profiler: Bruker DektakXT, STM-based SPM &#8211; JEOL JSPM-5200, Multipurpose Atomic Force Microscope: ParkAFM-NX10.\u00a0<\/p>\n\t\t\t\t\t<!-- \/content -->\n\t<!-- \/tabs -->\n<h3>\n\t\tStructural Characterization Tools\n\t<\/h3>\n\t\t\t\t<img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/cde.nus.edu.sg\/mse\/wp-content\/uploads\/sites\/4\/2024\/04\/hem.jpg\" alt=\"hem\" height=\"526\" width=\"823\" title=\"hem\" \/>\n\t<h3>Helium Ion Microscope(HIM)<\/h3>\nThis state-of-the-art instrument &#8220;Orion Nano-Fab&#8221; allows both fast machining of sub-10 nm structures and high-resolution surface-sensitive imaging in the same instrument. At the nanoscale, it enables imaging (topography), patterning, lithography, ion irradiation, compositional differences, crystal grains etc. It is equipped with electron flood gun, plasma cleaner and two beam sources Helium and Neon. The electron flood-gun enables easy imaging of insulating samples while plasma cleaner lets to remove the redundant hydrocarbon layers. The Gas field ion source (GFIS) technology &amp; advanced column for ultra-accurate beam focus and smaller sample interaction volume lead it to achieve sub-nanometer resolution.\n<hr \/>\n<strong>Technical Specifications:<\/strong>\n<ul>\n<li>Scanning ion microscope<\/li>\n<li>Source beam: Helium\/Neon<\/li>\n<li>Advanced Nanopatterning software: Nano-Patterning and Virtualization Engine(NPVE)<\/li>\n<li>ET secondary electron detector<\/li>\n<li>Electron flood gun for charge compensation<\/li>\n<li>Motorized 5 axis eucentric stage ( where x, y, z, r are all piezo driven)<\/li>\n<li>Field of view: 800 \u03bcm &#8211; 100 nm @ 8 mm working distance.<\/li>\n<li>Beam diameter: 0.5 nm @30kV; Beam energy: 10 &#8211; 30 kV; Beam current: 0.1 to 100 pA ( for Helium ion beam)<\/li>\n<li>Beam diameter: 1.9 nm @ 25kV; Beam energy: 10 &#8211; 25 kV; Beam current: 0.1 to 50 pA (for Neon ion beam)<\/li>\n<li>Patterning Resolution: ~ 8nm line width @25 kV for Helium and ~20 nm for Neon.<\/li>\n<li>Pattern generator frequency: 2GHz.<\/li>\n<li>Plasma cleaner (Evactron) for removing hydrocarbons.<\/li>\n<li>Stage travel: x = 48 mm, y = 48 mm, z = 8 mm, Rotation: 0 &#8211; 360\u00b0, Tilt: 0 &#8211; 54\u00b0<\/li>\n<\/ul>\n\t\t\t\t<img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/cde.nus.edu.sg\/mse\/wp-content\/uploads\/sites\/4\/2024\/04\/ram1.jpg\" alt=\"ram1\" height=\"517\" width=\"690\" title=\"ram1\" \/>\n\t<h3>Raman Spectrometer<\/h3>\nThe LabRAM HR Evolution Raman microscopes are ideally suited for both micro and macro measurements, and offer advanced confocal imaging capabilities in 2D and 3D. The true confocal Raman microscope enables the most detailed images and analyses to be obtained with speed and confidence. With guaranteed high performance and intuitive simplicity, the LabRAM HR Evolution is the ultimate instrument for Raman spectroscopy.\u00a0 They are widely used for standard Raman analysis, PhotoLuminescence\u00a0(PL),\u00a0Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.\n<strong>Technical Specifications<\/strong>\n<ul>\n<li>JY Horiba LabRAM Evolution<\/li>\n<li>Detector range- 550-1050nm, &gt; 70cm-1<\/li>\n<li>Excitation Laser: 488 nm &amp; 514 nm<\/li>\n<li>Able to measure both Raman and Photoluminescence<\/li>\n<li>Spatial mapping of surfaces<\/li>\n<li>Temperature Range: 10 K &#8211; 300 K<\/li>\n<li>Horiba Jobin Yvon LabRAM | Raman Lab<\/li>\n<\/ul>\n<h3>\n\t\tSurface Characterisation\/Morphology\n\t<\/h3>\n\t\t\t\t<img loading=\"lazy\" decoding=\"async\" src=\"https:\/\/cde.nus.edu.sg\/mse\/wp-content\/uploads\/sites\/4\/2024\/04\/multi-300x282-1.png\" alt=\"multi-300x282 (1)\" height=\"282\" width=\"300\" title=\"multi-300x282 (1)\" \/>\n\t<h3>Multipurpose Atomic Force Microscope: ParkAFM-NX10<\/h3>\n<p>The Park NX10 AFM features a True Non-Contact\u2122 scan Mode that produces high resolution and accurate data by preventing destructive tip-sample interaction during a scan. Its compact and rigid &#8216;Step-and-Scan&#8217; enables programmable multiple region imaging.<\/p>\n<p>______________________________________________________________________________________<\/p>\n<p><strong>Technical Specifications<\/strong><\/p>\n<ul>\n<li>2D Flexure-Guided Scanner with XY Scan Range 50 \u03bcm x 50 \u03bcm<\/li>\n<li>XY-resolution: 0.05 nm<\/li>\n<li>Z-Resolution: 015 nm<\/li>\n<li>Field-of-view: 480 \u00b5m \u00d7 360 \u00b5m (with 10\u00d7 objective lens)<\/li>\n<li>Powerful system control and data acquisition software (Park SmartScan<sup>TM<\/sup>)<\/li>\n<li>Auto mode for quick setup and easy imaging<\/li>\n<li>Stand-alone design of AFM data analysis software &#8216;XEI&#8217;<\/li>\n<\/ul>\n<p><strong>Incorporated Scanning Modes<\/strong><\/p>\n<ul>\n<li>True Non-ContactTM mode<\/li>\n<li>Intermittent (tapping) mode<\/li>\n<li>Contact mode<\/li>\n<li>Phase imaging<\/li>\n<li>Lateral Force Microscopy (LFM)<\/li>\n<li>Force-Distance (F\/D) Spectroscopy<\/li>\n<li>Piezoelectric Force Microscopy (PFM)<\/li>\n<li>Electric Force Microscopy (EFM)<\/li>\n<li>Kelvin Probe Force Microscopy (KPFM)<\/li>\n<li>Magnetic Force Microscopy (MFM)<\/li>\n<li>Conductive AFM (C-AFM)<\/li>\n<li>QuickStep Scanning Capacitance Microscopy (SCM)<\/li>\n<li>PinPoint\u2122 Conductive AFM<\/li>\n<li>Nanoindentation<\/li>\n<li>Nanolithography<\/li>\n<li>Force Modulation Microscopy (FMM)<\/li>\n<\/ul>\n\n","protected":false},"excerpt":{"rendered":"<p>Structural Characterisation Providing a wide range of tool, training and expertise for Topographic imaging structural characterisation of nanoscale materials. Structural Charactierisation Facilities The facility is well equipped with various state-of-art facilities for Nano-Fabrication, Topographic imaging and structural characterization such as Helium Ion Microscope (Orion Nano-Fab), AFM\/SPM, Raman spectrometer, Direct laser writer, mask aligner etc. The [&hellip;]<\/p>\n","protected":false},"author":285,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"site-sidebar-layout":"default","site-content-layout":"default","ast-site-content-layout":"default","site-content-style":"default","site-sidebar-style":"default","ast-global-header-display":"","ast-banner-title-visibility":"","ast-main-header-display":"","ast-hfb-above-header-display":"","ast-hfb-below-header-display":"","ast-hfb-mobile-header-display":"","site-post-title":"","ast-breadcrumbs-content":"","ast-featured-img":"","footer-sml-layout":"","theme-transparent-header-meta":"default","adv-header-id-meta":"","stick-header-meta":"","header-above-stick-meta":"","header-main-stick-meta":"","header-below-stick-meta":"","astra-migrate-meta-layouts":"set","ast-page-background-enabled":"default","ast-page-background-meta":{"desktop":{"background-color":"var(--ast-global-color-4)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-gradient":""},"tablet":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-gradient":""},"mobile":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-gradient":""}},"ast-content-background-meta":{"desktop":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-gradient":""},"tablet":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-gradient":""},"mobile":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-gradient":""}},"footnotes":""},"class_list":["post-16506","page","type-page","status-publish","hentry"],"acf":[],"_links":{"self":[{"href":"https:\/\/cde.nus.edu.sg\/mse\/wp-json\/wp\/v2\/pages\/16506","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/cde.nus.edu.sg\/mse\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/cde.nus.edu.sg\/mse\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/cde.nus.edu.sg\/mse\/wp-json\/wp\/v2\/users\/285"}],"replies":[{"embeddable":true,"href":"https:\/\/cde.nus.edu.sg\/mse\/wp-json\/wp\/v2\/comments?post=16506"}],"version-history":[{"count":10,"href":"https:\/\/cde.nus.edu.sg\/mse\/wp-json\/wp\/v2\/pages\/16506\/revisions"}],"predecessor-version":[{"id":17198,"href":"https:\/\/cde.nus.edu.sg\/mse\/wp-json\/wp\/v2\/pages\/16506\/revisions\/17198"}],"wp:attachment":[{"href":"https:\/\/cde.nus.edu.sg\/mse\/wp-json\/wp\/v2\/media?parent=16506"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}