{"id":8076,"date":"2021-12-08T17:08:01","date_gmt":"2021-12-08T09:08:01","guid":{"rendered":"https:\/\/cde.nus.edu.sg\/mse\/?page_id=8076"},"modified":"2026-03-18T11:31:09","modified_gmt":"2026-03-18T03:31:09","slug":"facilities","status":"publish","type":"page","link":"https:\/\/cde.nus.edu.sg\/mse\/facilities\/","title":{"rendered":"Facilities"},"content":{"rendered":"\n

\n\t\tFacilities\n\t<\/h1>\n\tAdvanced Materials Characterization:
\n<\/strong>The state-of-the-art research facilities in the Department of Materials Science and Engineering enable comprehensive material analysis, ranging from atomic ordering and precise chemical composition to thermal, optical, mechanical, structural, and electronic properties, as well as detailed microstructural characterization at the atomic level.\n\t\t\t\t\"STEM\"\n\tSTEM<\/strong>:
\nThe highest-resolution microscopy technique. It can image and generate elemental maps at atomic resolution, using a focused <0.1 nm electron beam that scans across a thin sample.\n\n\t\t\t\t\"FIB\"\n\tFIB<\/strong>:
\nUsed for making cross-sectional samples. An electron beam and ion beam are combined in one instrument, with the focused ion beam able to very locally sputter (remove) material, exposing the underlaying layers.\n\t\t\t\t\"HRTEM\"\n\tHRTEM<\/strong>:
\nTransmission electron microscopes are used for imaging materials at almost atomic resolution. TEMs can also image electron diffraction patterns, to precisely measure the local atomic structure of a material.\n\t\t\t\t\"SEM\"\n\tSEM<\/strong>:
\nThe Scanning Electron Microscope uses a gentle electron beam to precisely image the top surface of a material, and to map the local elemental composition.\n\n\t\t\t\t\"XRD\"\n\tXRD<\/strong>:
\nX-ray diffraction is the most accurate technique for learning about the way atoms are ordered in materials: are they amorphous or crystalline, and how exactly are the atoms ordered in the crystals?\n\n\t\t\t\t\"SAXS\"\n\tSAXS<\/strong>:
\nX-ray diffraction with a wide field of view. Can accurately measure the atomic ordering of non-powder samples with large crystals, and of particle suspensions.\n\n\t\t\t\n\t\t\t\t\t\t\tBook Facilities\n\t\t\t\t\t<\/a>\n\t\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
Equipment Name \/
\nService Description<\/th>\n		Equipment Location<\/th>\nMSE Internal
\nCharge Rate
\n(run by user)<\/em><\/th>\n		NUS Internal
\nCharge Rate
\n(run by user)<\/em><\/th>\n		NUS Internal
\nCharge Rate
\n(run by LO) <\/em><\/th>\n		Outside NUS
\nCharge Rate
\n(run by LO)<\/em><\/th>\n		Contact
\nPerson<\/th>\n		Email<\/th>\n<\/tr>\n
\u00a0<\/th>\n\u00a0<\/th>\n$\/hr<\/th>\n$\/hr<\/th>\n$\/hr <\/th>\n$\/hr <\/th>\n\n\u00a0<\/th>\n<\/tr>\n
TEM JEOL 3010F<\/a><\/td>\nBlk E4
\n#02-02<\/td>\n		50
\n(excluding consumables)<\/td>\n		100
\n(excluding consumables)<\/td>\n		300
\n(excluding consumables)<\/td>\n		450<\/td>\nYang Fengzhen<\/td>\nmseyf@nus.edu.sg<\/a><\/td>\n<\/tr>\n
TEM JEOL 2800<\/td>\nBlk E7
\nLevel 1<\/td>\n		70
\n(excluding consumables)<\/td>\n		150
\n(excluding consumables)<\/td>\n		300
\n(excluding consumables)<\/td>\n		500<\/td>\nYang Fengzhen<\/td>\nmseyf@nus.edu.sg<\/a><\/td>\n<\/tr>\n
TEM JEOL 2010F<\/a><\/td>\nBlk E4
\n#02-02<\/td>\n		50
\n(excluding consumables)<\/td>\n		100
\n(excluding consumables)<\/td>\n		300
\n(excluding consumables<\/td>\n		500<\/td>\nYang Fengzhen<\/td>\nmseyf@nus.edu.sg<\/a><\/td>\n<\/tr>\n
Raman Spectrometer, Horiba Labram<\/a><\/td>\nBlk E3A
\n#05-08<\/td>\n		25<\/td>\n80<\/td>\n120<\/td>\n200<\/td>\nSerene Chooi<\/td>\nmseckms@nus.edu.sg<\/a><\/td>\n<\/tr>\n
Scanning Electron Microscope (SEM); Zeiss Sigma 300<\/a><\/td>\nBlk E3A
\n#05-11A<\/td>\n		40<\/td>\n90<\/td>\n180<\/td>\n220<\/td>\nShen Jingjing<\/td>\nshenjj2@nus.edu.sg<\/a><\/td>\n<\/tr>\n
SEM JEOL JSM-IT800SHL<\/a><\/td>\nBlk E3A
\n#05-11A<\/td>\n		50<\/td>\n100<\/td>\n220<\/td>\n280<\/td>\nShen Jingjing<\/td>\nshenjj2@nus.edu.sg<\/a><\/td>\n<\/tr>\n
High Temperature
\nFurnaces<\/td>\n		Blk E3A
\n#05-04<\/td>\n		15 (or 40\/day)<\/td>\n40<\/td>\n40<\/td>\nNot available<\/td>\nAlaric Wong<\/td>\nalaricw@nus.edu.sg<\/a><\/td>\n<\/tr>\n
Malvern ZetaSizer Nano<\/a><\/td>\nBlk E3A
\n#05-10<\/td>\n		15<\/td>\n40<\/td>\n60<\/td>\n150 per sample<\/td>\nShen Jingjing<\/td>\nshenjj2@nus.edu.sg<\/a><\/td>\n<\/tr>\n
Micromeritics ASAP
\nSurface Area and
\nPorosity Analyzer<\/a><\/td>\n		Blk E3A
\n#05-10<\/td>\n		75\/day<\/td>\n300\/day<\/td>\n800\/day<\/td>\n1400 per day<\/td>\nShen Jingjing<\/td>\nshenjj2@nus.edu.sg<\/a><\/td>\n<\/tr>\n
Powder XRD, Bruker D8 Advance<\/a><\/td>\nBlk E3A
\n#05-15<\/td>\n		35<\/td>\n120<\/td>\n160<\/td>\n180<\/td>\nChen Qun<\/td>\nmsechenq@nus.edu.sg<\/a><\/td>\n<\/tr>\n
Thin Film XRD, Bruker D8 Advance<\/a><\/td>\nBlk E3A
\n#05-15<\/td>\n		35<\/td>\n120<\/td>\n160<\/td>\n180<\/td>\nChen Qun<\/td>\nmsechenq@nus.edu.sg<\/a><\/td>\n<\/tr>\n
Non ambient temperature Powder XRD, PANalytical
\nX’Pert PRO<\/a><\/td>\n		Blk E3A
\n#05-15<\/td>\n		40<\/td>\n120<\/td>\n180<\/td>\n220<\/td>\nChen Qun<\/td>\nmsechenq@nus.edu.sg<\/a><\/td>\n<\/tr>\n
High resolution XRD; Bruker D8 Discover<\/a><\/td>\nBlk E3A
\n#05-15<\/td>\n		35<\/td>\n120<\/td>\n160<\/td>\n180<\/td>\nChen Qun<\/td>\nmsechenq@nus.edu.sg<\/a><\/td>\n<\/tr>\n
Small-angle X-ray scattering system (SAXS), Xenocs 2.0<\/td>\nBlk E3A
\n#05-15<\/td>\n		40<\/td>\n120<\/td>\n160<\/td>\n200<\/td>\nChen Qun<\/td>\nmsechenq@nus.edu.sg<\/a><\/td>\n<\/tr>\n
Step profiler KLA Tencor Alpha-Step IQ (step height measurement only)<\/a><\/td>\nBlk E3A
\n#05-08<\/td>\n		10<\/td>\n25<\/td>\n40<\/td>\n50 per hr +
\n30 per sample<\/td>\n		Henche Kuan<\/td>\nmsehk@nus.edu.sg<\/a><\/td>\n<\/tr>\n
Vibrating-sample magnetometer (VSM), Lake Shore 7407<\/td>\nBlk E3A
\n05-01<\/td>\n		60<\/td>\n90<\/td>\n120<\/td>\n150<\/td>\nChen Qun<\/td>\nmsechenq@nus.edu.sg<\/a><\/td>\n<\/tr>\n
Hall Effect Measurement System<\/td>\nBlk E3A
\n#05-07<\/td>\n		30<\/td>\n90<\/td>\n120<\/td>\n150<\/td>\nChen Qun<\/td>\nmsechenq@nus.edu.sg<\/a><\/td>\n<\/tr>\n
Polarizing Microscope w Heating Stage<\/td>\nBlk E3A
\n#05-07<\/td>\n		15<\/td>\n30<\/td>\n50<\/td>\n80<\/td>\nChen Qun<\/td>\nmsechenq@nus.edu.sg<\/a><\/td>\n<\/tr>\n
DSC (Differential Scanning Calorimetry) TA Instruments DSC 25<\/a><\/td>\nBlk E3A
\n#05-08<\/td>\n		15
\n(excluding consumables)<\/td>\n		40
\n(excluding consumables)<\/td>\n		60
\n(excluding consumables)<\/td>\n		80 per hr +
\n80 per sample<\/td>\n		Henche Kuan<\/td>\nmsehk@nus.edu.sg<\/a><\/td>\n<\/tr>\n
TGA (Thermogravimetry Analysis)
\nTA Instruments TGA Q50 or Q500<\/a><\/td>\n		Blk E3A
\n#05-08<\/td>\n		15
\n(excluding consumables)<\/td>\n		40
\n(excluding consumables)<\/td>\n		60
\n(excluding consumables)<\/td>\n		80 per hr +
\n80 per sample<\/td>\n		Henche Kuan<\/td>\nmsehk@nus.edu.sg<\/a><\/td>\n<\/tr>\n
FTIR spectrometer<\/a>
\nPerkin-Elmer Spectrum Two<\/a><\/td>\n		Blk E3A #05-06<\/td>\n15<\/td>\n30<\/td>\n40<\/td>\n60 per hr + 80 per sample<\/td>\nHenche Kuan<\/td>\nmsehk@nus.edu.sg\u00a0<\/a><\/td>\n<\/tr>\n
Fluorescence spectrometer<\/a>
\nPerkin-Elmer FL-6500<\/a><\/td>\n		Blk E3A #05-06<\/td>\n15<\/td>\n30<\/td>\n40<\/td>\n60 per hr + 80 per sample<\/td>\nHenche Kuan<\/td>\nmsehk@nus.edu.sg\u00a0<\/a><\/td>\n<\/tr>\n
UV-VIS-NIR spectrometer Agilent Cary 5000<\/a><\/td>\nBlk E3A #05-06<\/td>\n15<\/td>\n30<\/td>\n40<\/td>\n60 per hr + 80 per sample<\/td>\nHenche Kuan<\/td>\nmsehk@nus.edu.sg<\/a><\/td>\n<\/tr>\n
UV-Vis spectrometer Shimadzu UV-1900<\/a><\/td>\nBlk E3A #05-06<\/td>\n10<\/td>\n25<\/td>\n40<\/td>\n50 per hr + 60 per sample<\/td>\nHenche Kuan<\/td>\nmsehk@nus.edu.sg<\/a><\/td>\n<\/tr>\n
FTIR spectrometer Agilent Cary 660<\/a><\/td>\nBlk E3A #05-06<\/td>\n15<\/td>\n30<\/td>\n40<\/td>\n60 per hr +
\n100 per sample<\/td>\n		Henche Kuan<\/td>\nmsehk@nus.edu.sg<\/a><\/td>\n<\/tr>\n
Stylus profilometer Bruker Dektak-XT<\/a><\/td>\nBlk E3A #05-08<\/td>\n10<\/td>\n25<\/td>\n40<\/td>\n50 per hr + 30 per sample<\/td>\nHenche Kuan<\/td>\nmsehk@nus.edu.sg<\/a><\/td>\n<\/tr>\n
UV-Vis spectrometer with integrating sphere Shimadzu UV-2600i<\/a><\/td>\nBlk E3A #05-06<\/td>\n15<\/td>\n30<\/td>\n40<\/td>\n60 per hr + 80 per sample<\/td>\nHenche Kuan<\/td>\nmsehk@nus.edu.sg<\/a><\/td>\n<\/tr>\n
Four-point Probe<\/a><\/td>\nBlk E3A
\n#05-07<\/td>\n		10
\n(excluding consumables)<\/td>\n		20
\n(excluding consumables)<\/td>\n		30
\n(excluding consumables)<\/td>\n		40 per hr +
\n40 per sample<\/td>\n		Chan Yew Weng<\/td>\nmsecyw@nus.edu.sg<\/a><\/td>\n<\/tr>\n
Universal Testing Machine, Lloyd<\/a><\/td>\nBlk E3A
\n#05-07<\/td>\n		10<\/td>\n30<\/td>\n45<\/td>\n150<\/td>\nChan Yew Weng<\/td>\nmsecyw@nus.edu.sg<\/a><\/td>\n<\/tr>\n
Polishing Machine<\/a><\/td>\nBlk E3A
\n#05-02<\/td>\n		5<\/td>\n15<\/td>\n45<\/td>\n150<\/td>\nChan Yew Weng<\/td>\nmsecyw@nus.edu.sg<\/a><\/td>\n<\/tr>\n
Metallurigical Microscope<\/a><\/td>\nBlk E3A
\n#05-02<\/td>\n		10<\/td>\n20<\/td>\n45<\/td>\n150<\/td>\nHenche Kuan<\/td>\nmsehk@nus.edu.sg<\/a><\/td>\n<\/tr>\n
Hardness Tester,
\nIndentec<\/a><\/td>\n		Blk E3A
\n#05-07<\/td>\n		10<\/td>\n30<\/td>\n50<\/td>\n60 per sample<\/td>\nChan Yew Weng<\/td>\nmsecyw@nus.edu.sg<\/a><\/td>\n<\/tr>\n
Digital Light Processing Printer (microArch S140)<\/td>\nBlk E3A
\n#05-16<\/td>\n		30<\/td>\n\n\n\nDr. Manohar Salla<\/td>\nmsems@nus.edu.sg<\/a><\/td>\n<\/tr>\n
Digital Light Processing Printer
\n(MicroSLA Micro 2-5um)<\/td>\n		Blk E3A
\n#05-16<\/td>\n		20<\/td>\n\n\n\nDr. Manohar Salla<\/td>\nmsems@nus.edu.sg<\/a><\/td>\n<\/tr>\n
FDM (Fused Deposition Modelling) printer
\n(Bambu Lab, X1C)<\/td>\n		Blk E3A
\n#05-16<\/td>\n		12<\/td>\n\n\n\nDr. Manohar Salla<\/td>\nmsems@nus.edu.sg<\/a><\/td>\n<\/tr>\n
Anton Parr Modular Compact Rheometer (MCR302e)<\/td>\nBlk E3A
\n#05-10<\/td>\n		30<\/td>\n\n\n\nMr. Wong Wai Kong Alaric<\/td>\nalaricw@nus.edu.sg<\/a><\/td>\n<\/tr>\n
Femtosecond Laser Micro Machining System FreeDo F5<\/td>\nBlk E3A
\n#05-16<\/td>\n		50<\/td>\n\n\n\nDr. Manohar Salla<\/td>\nmsems@nus.edu.sg<\/a><\/td>\n<\/tr>\n
MIRA 7 Laser Cutting Machine & Filter Fume Extractor (YC3109)<\/td>\nBlk E3A
\n#05-16<\/td>\n		20<\/td>\n\n\n\nDr. Manohar Salla<\/td>\nmsems@nus.edu.sg<\/a><\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n\n","protected":false},"excerpt":{"rendered":"

Facilities Advanced Materials Characterization: The state-of-the-art research facilities in the Department of Materials Science and Engineering enable comprehensive material analysis, ranging from atomic ordering and precise chemical composition to thermal, optical, mechanical, structural, and electronic properties, as well as detailed microstructural characterization at the atomic level. STEM: The highest-resolution microscopy technique. It can image and […]<\/p>\n","protected":false},"author":79,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"site-sidebar-layout":"default","site-content-layout":"default","ast-site-content-layout":"default","site-content-style":"default","site-sidebar-style":"default","ast-global-header-display":"","ast-banner-title-visibility":"","ast-main-header-display":"","ast-hfb-above-header-display":"","ast-hfb-below-header-display":"","ast-hfb-mobile-header-display":"","site-post-title":"","ast-breadcrumbs-content":"","ast-featured-img":"","footer-sml-layout":"","theme-transparent-header-meta":"default","adv-header-id-meta":"","stick-header-meta":"","header-above-stick-meta":"","header-main-stick-meta":"","header-below-stick-meta":"","astra-migrate-meta-layouts":"set","ast-page-background-enabled":"default","ast-page-background-meta":{"desktop":{"background-color":"var(--ast-global-color-4)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-gradient":""},"tablet":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-gradient":""},"mobile":{"background-color":"","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-gradient":""}},"ast-content-background-meta":{"desktop":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-gradient":""},"tablet":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-gradient":""},"mobile":{"background-color":"var(--ast-global-color-5)","background-image":"","background-repeat":"repeat","background-position":"center center","background-size":"auto","background-attachment":"scroll","background-type":"","background-media":"","overlay-type":"","overlay-color":"","overlay-gradient":""}},"footnotes":""},"class_list":["post-8076","page","type-page","status-publish","hentry"],"acf":[],"_links":{"self":[{"href":"https:\/\/cde.nus.edu.sg\/mse\/wp-json\/wp\/v2\/pages\/8076","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/cde.nus.edu.sg\/mse\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/cde.nus.edu.sg\/mse\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/cde.nus.edu.sg\/mse\/wp-json\/wp\/v2\/users\/79"}],"replies":[{"embeddable":true,"href":"https:\/\/cde.nus.edu.sg\/mse\/wp-json\/wp\/v2\/comments?post=8076"}],"version-history":[{"count":4,"href":"https:\/\/cde.nus.edu.sg\/mse\/wp-json\/wp\/v2\/pages\/8076\/revisions"}],"predecessor-version":[{"id":19492,"href":"https:\/\/cde.nus.edu.sg\/mse\/wp-json\/wp\/v2\/pages\/8076\/revisions\/19492"}],"wp:attachment":[{"href":"https:\/\/cde.nus.edu.sg\/mse\/wp-json\/wp\/v2\/media?parent=8076"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}