WELCOME
The Electron Microscopy Facility (EMF) at NUS is a university-level research facility focused on the science and application of electron/ion-beam microscopy and other advanced characterization techniques. At EMF, we serve all institutional departments by providing state-of-the-art instrumentation and the expertise required for high-resolution imaging — down to the atomic-level — of a wide variety of materials.
Our comprehensive suite of instrumentation includes a 5th order aberration-corrected scanning transmission electron microscope (STEM) equipped with Energy-Dispersive X-ray Spectrometer (EDS), Electron Energy Loss Spectrometer (EELS), 4D-STEM detector, and a variety of in-situ sample holders (cryo/vacuum transfer, biasing & heating, gas cell), an ultra wide field-of-view atom probe tomography (APT) microscope for 3D mass-spectrometry analysis, as well as He-ion, Ne-ion, and Ga-ion focused ion beams for patterning and sample preparation.


















