Transmission Electron Microscopes
Aberration-corrected Analytical S/TEM
JEOL JEM-ARM200F
The JEM-ARM200F is a 200kV cold field-emission, probe-corrected transmission electron microscope with a STEM resolution of 0.078 nm and TEM resolution of 0.1 nm. It also has an energy-dispersive X-ray detector and dual energy loss spectrometers that can form elemental maps at atomic resolution, and a fast CMOS camera. With its probe aberration corrector and ultra-high-resolution pole-piece it is particularly suited to STEM imaging and analysis.
- Cold field-emission gun
- CEOS ASCOR aberration corrector
- UHR pole piece
- Spatial resolution: 78 pm (STEM)
- Energy resolution: 0.3 eV
| Detectors | |
|---|---|
| TEM/HRTEM | Gatan One-View CMOS, Orius SC200D |
| STEM | JEOL HAADF/LAADF/BF |
| 4D STEM | Quantum Detectors MerlinEM |
| EDS | Oxford X-MaXN 100TLE SDD |
| EELS | Gatan GIF Quantum energy filters |
Location: E7-01
Lee Cheng Choo
cl.cheng@nus.edu.sg
High-throughput Analytical S/TEM
JEOL JEM-2800
The JEM-2800 is an advanced workhorse 200 kV transmission electron microscope with a Schottky-type field emission electron source. This multi-purpose S/TEM employs an user-friendly, high-stability operating system for high-resolution imaging in TEM (including diffraction modes) and STEM (imaging and EDS). Equipped with a TMP vacuum system, the JEM-2800 is particularly suited for fast screening of multiple samples.
- Schottky-type electron gun
- Highly stable eucentric side-entry goniometer stage
- TMP vacuum system
- Spatial resolution: 0.1 nm (TEM), 0.2 nm (STEM)
| Detectors | |
|---|---|
| TEM/HRTEM | Gatan Rio CMOS |
| STEM | JEOL ADF/BF |
| EDS | JEOL SDD |
Location: E7-01
Lee Cheng Choo
cl.cheng@nus.edu.sg
High-resolution Analytical TEM
JEOL 2010F
The JEOL 2010F TEM provides both conventional and high resolution TEM imaging using a Field Emission tip. It is equipped with single tilt, double-tilt, and multi-sample holders for fast screening of samples.
- Cold field-emission gun
- Spatial Resolution: 0.19 nm (HRTEM)
| Detectors | |
|---|---|
| TEM/HRTEM | Gatan CCD |
| EDS | Oxford |
Location: E4-02-02
Yang Fengzhen
mseyf@nus.edu.sg
Educational TEM
JEOL 3010
The JEOL 3010 is a 300kV transmission electron microscope with a LaB6 electron source. Being capable of high-resolution, micro-area analysis, electron diffraction, and convergent beam electron diffraction techniques, this system has been adapted for educational purposes.
- Cold field-emission gun
- Spatial Resolution: 0.17 nm (HRTEM)
| Detectors | |
|---|---|
| TEM/HRTEM | Gatan CCD |
Location: E4-02-02
Yang Fengzhen
mseyf@nus.edu.sg