LIST OF TOOLS IN THE RESPECTIVE LOCATION
- DRY LAB
- METROLOGY & TEST
- CHARACTERISATION
- PACKAGING
- MBE
- OTHERS
THERMAL EVAPORTOR |
Edward Evaporation System for Metal Deposition
Model: Edward Auto 306 Turbo ![]() |
E-BEAM EVAPORTOR |
E-Beam Evaporation System for Metal Deposition![]() |
FE-SEM (Ultra High Resolution) |
System Overview
Multi-signal detection and imaging system, for elemental composition, crystal and surface information.
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High Resolution Imaging ![]() |
JEOL JSM 6700F |
System Overview![]() |
RAMAN AND MICRO PL SYSTEM |
System Overview
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WAFER DICER |
System Overview
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VSM |
System Overview
The EZ 9 VSM is dedicated for measurement of the magnetic moment of materials as a function of field, angle, temperature, time.
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SMOKE |
System Overview
By application of the magneto optical Kerr effect, the rotation of the polarization plane of the reflected light is transformed into a contrast by means of an analyser when the domain magnetization direction change.
The E6NanoFab Evico Magneto-Optical Kerr Microscope & Magnetometer in is able to visualisation of magnetic domains and magnetization processes as well as for optically recording magnetization curves qualitatively on all kinds of magnetic materials, including bulk specimens like sheets or ribbons, magnetic films and multilayers, patterned films or micro- and nanowires.
The In-plane magnetic field range from 10-4 Tesla up to 1.3 Tesla, depends on pole piece configuration and choice of coils. And the observation area is 8 mm x 8 mm min and 30 mm x 30 mm max.
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SQUID |
System Overview
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SPM |
System Overview
The Bruker Dimension Icon AFM incorporates the latest evolution of Bruker’s industry-leading nanoscale imaging and characterization technologies on a large sample tip-scanning AFM platform. The Icon’s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y.
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XRD |
System Overview
Multipurpose XRD
Technical Specifications
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WIRE BONDER |
System Overview
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MOLECULAR BEAM EPITAXY (MBE) SYSTEM FOR THE GROWTH OF A RANGE OF GROUP II-VI and IV MATERIALS |
System Overview
The fully integrated MBE system allows deposition of hetero-structures and semiconductors. II-VI and IV group deposition chambers are integrated with transfer chamber and load lock. The system has 5 ports for each chamber.
Technical specifications:
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LASER MICRO-MACHINING SERVICE |
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Overview Custom Laser micro-machine system operating on a femtosecond pulsed laser. The short pulse length limits local heating effects reducing Heat Affected Zone (HAZ). Applicable in wide range of materials. Especially effective for ceramics, metals and selected Polymers. • Ceramics* : Alumina oxide, Aluminium nitride , etc • Wafers* : Silicon, Silicon Nitride, Silica (Glass), etc • Polymers : Polyamide, Kapton, PMMA etc. • Metals* : Stainless Steel, Copper, Aluminium etc. We routinely perform and achieve the following precision: 1. 15 micron Percussion holes on ceramics, thin metals and silicon wafers with precision of <1 micron for ceramics. 2. 30 micron minimum Circular holes on ceramics, thin metals and silicon wafers with highest precision of <1micron for ceramics. 3. Smallest feature size > 20 microns with precision 1 micron on metal sheets, ceramics and polymers. 4. Dicing of Silicon wafer up to 750um thick with negligible dust on surface. Remarks: Subjected to maximum material thickness between 500um ~ 700um*
Electrodes for ion trapping: We provide blade electrodes for 3D ion traps based on ceramic materials. These are used for quantum information processing and atomic clock projects. Sample: 50um slot milling on 250um thickness Alumina oxide.
Sample: Consistent output of 50um Polymer strip with 50um thickness material.
Sample: Precision percussion holes on thin Graphene sheet. For quotation, please send your request to the person in charge stating your sample feature sizes, tolerances, volume, and materials. Tel: 6516 8549 Email: joven@nus.edu.sg In Charge: Mr Joven Kwek |