Fe-SEM (ULTRA HIGH RESOLUTION) System OverviewMulti-signal detection and imaging system, for elemental composition, crystal and surface information.Model: Hitachi Regulus 8100 Technical SpecificationsAccelerating Voltage: 0.5 – 30kVResolution: 0.8nm at 15kV (SE) 1.1nm at 1kV w/ deceleration (SE)Magnification Range: 20X – 2,000 X (Low Mag) 100X – 1,000,000X (High Mag)Detectors: Lower/ Upper/ Top, YAG BSE, STEM (Bright-Field/ PD-Dark Field).Stage Traverse: (5-axis Motorized) X: 0 – 110mm Y: 0 – 11mm Z: 1.5 – 40mm R: 360° T: -5° – +70°Observable Range: 150mm dia. (MAX Sample Size)Specimen Exchange Chamber size: 6 inch dia.Mountable specimen thickness: 27mm (Diameter ≦ 33mm) Location: E6-01, L1 Cleanroom Contact: e6nanofab@nus.edu.sg