Electronic Trap Detection with Carrier-Resolved Photo-Hall Effect Click for more details Event Details Date & Time 2 October 2026, Friday11:00 AM - 12:00 PM Venue EA-06-04 SEMINAR ROOM, 9 Engineering Dr 1, Singapore 117575 Event URL https://cde.nus.edu.sg/mse/wp-content/uploads/sites/4/2026/09/Dept_seminar_Prof-Shin.pdf ← Previous EventNext Event →