We provide a wide range of tool, training and expertise for Topographic imaging structural characterisation of nanoscale materials.

Structural Charactierisation Facilities

We are well equipped with various state-of-art facilities for Nano-Fabrication, Topographic imaging and structural characterization such as Helium Ion Microscope (Orion Nano-Fab), AFM/SPM, Raman spectrometer, Direct laser writer, mask aligner etc.

Our various facilities are supported by postdoctoral fellows and PhD students who are superusers for specific equipments and manage the facility along with their research work and hence, our facility empowers us to continue doing not only our research but also to provide/share these facilities with the interested researchers across the campus. These include:

• Our high resolution helium ion microscope is equipped with SE2 detector, charge neutralizer and plasma cleaner to handle a broad range of specimens.
• The focused helium ion beam with sub-nm probe size enables users to write sub-10nm structures by direct milling.
• The Neon ion beam is used to create the desired patterns by fast milling.
• The electron flood gun enables to image insulating samples without any conductive coating which is very essential for biological/insulating specimens.
• Direct laser writer along with Orion Nano-Fab enables to cutting-edging device fabrications.

Our labs for respective equipments are well designed to avoid any external disturbances such as acoustics, vibration, air flow, temperature, light etc. room/low temperature Raman along with PL enables us to probe structural fingerprints of the specimens: