MATERIAL CHARACTERIZATION AND PROCESS CONTROL – E6NANOFAB

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Ellipsometer_E6 L1 CR Yellow Lab (Demo)

By Characterisation and Metrology L5 CR MATERIAL CHARACTERIZATION AND PROCESS CONTROL

Ellipsometer – Semilab SE-2000

Optical-Microscope-300x300 (Demo)

By L1 CR MATERIAL CHARACTERIZATION AND PROCESS CONTROL

Optical Microscope – Nikon Eclipse L200N / Keyence VHX

e6nanofab; unveristy nabofabrication facility

By Characterisation and Metrology L1 CR MATERIAL CHARACTERIZATION AND PROCESS CONTROL

Raman Microscope – Renishaw inVia

L1 CR Class 100 FTIR (Demo)

By Characterisation and Metrology Cleanrooms DL Metrology & Test L1 CR MATERIAL CHARACTERIZATION AND PROCESS CONTROL

FTIR Spectroscopy

PARK_AFM E6-01-02 (Demo)

By Characterisation and Metrology L1 CR MATERIAL CHARACTERIZATION AND PROCESS CONTROL

Atomic Force/Scanning Probe Microscopy – Park NX20