Characterisation and Metrology – E6NANOFAB

Skip to main content Scroll Top

Ellipsometer_E6 L1 CR Yellow Lab (Demo)

By Characterisation and Metrology L5 CR MATERIAL CHARACTERIZATION AND PROCESS CONTROL

Ellipsometer – Semilab SE-2000

20180227_XRD L5 (Demo)

By Characterisation Characterisation and Metrology METROLOGY

XRD

L5 Characterization_Bruker_SPM_E6-05-08A (Demo)

By Characterisation Characterisation and Metrology METROLOGY

SPM

SQUID (Demo)

By Characterisation Characterisation and Metrology MAGNETIC CHARACTERIZATION

Superconducting Quantum Interference Device Magnetometer – Quantum Design MPMS3

SMOKE (Demo)

By Characterisation Characterisation and Metrology MAGNETIC CHARACTERIZATION

Scanning Magneto-Optical Kerr -Microscope – Evico Magnetics – S-MOKE

VSM

By Characterisation Characterisation and Metrology MAGNETIC CHARACTERIZATION

VSM

e6nanofab; unveristy nabofabrication facility

By Characterisation and Metrology L1 CR MATERIAL CHARACTERIZATION AND PROCESS CONTROL

Raman Microscope – Renishaw inVia

L1 CR Class 100 FTIR (Demo)

By Characterisation and Metrology Cleanrooms DL Metrology & Test L1 CR MATERIAL CHARACTERIZATION AND PROCESS CONTROL

FTIR Spectroscopy

PARK_AFM E6-01-02 (Demo)

By Characterisation and Metrology L1 CR MATERIAL CHARACTERIZATION AND PROCESS CONTROL

Atomic Force/Scanning Probe Microscopy – Park NX20