Characterisation and Metrology – E6NANOFAB

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Ellipsometer_E6 L1 CR Yellow Lab (Demo)

By Characterisation and Metrology L5 CR MATERIAL CHARACTERIZATION AND PROCESS CONTROL

Ellipsometer – Semilab SE-2000

20180227_XRD L5 (Demo)

By Characterisation Characterisation and Metrology METROLOGY

X-ray Diffractometer (XRD) – Rigaku SmartLab

L5 Characterization_Bruker_SPM_E6-05-08A (Demo)

By Characterisation Characterisation and Metrology METROLOGY

Surface Profiler – Bruker DektakXT

SQUID (Demo)

By Characterisation Characterisation and Metrology MAGNETIC CHARACTERIZATION

Superconducting Quantum Interfernce Device (SQUID) Magnetometer – Quantum Design MPMS3

SMOKE (Demo)

By Characterisation Characterisation and Metrology MAGNETIC CHARACTERIZATION

Scanning Magneto-Optical Kerr Effect (SMOKE) Microscope – Evico Magnetics

VSM

By Characterisation Characterisation and Metrology MAGNETIC CHARACTERIZATION

Vibrating Sample Magnetometer (VSM) – MicroSense EZ9

e6nanofab; unveristy nabofabrication facility

By Characterisation and Metrology L1 CR MATERIAL CHARACTERIZATION AND PROCESS CONTROL

Raman Microscope – Renishaw inVia

L1 CR Class 100 FTIR (Demo)

By Characterisation and Metrology Cleanrooms DL Metrology & Test L1 CR MATERIAL CHARACTERIZATION AND PROCESS CONTROL

Fourier Transform Infrared (FTIR) Spectrometer – Thermo Fisher Nicolet iS50

PARK_AFM E6-01-02 (Demo)

By Characterisation and Metrology L1 CR MATERIAL CHARACTERIZATION AND PROCESS CONTROL

Atomic Force/Scanning Probe Microscopy (AFM/SPM) – Park NX20