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20180227_XRD L5 (Demo)
By Characterisation Characterisation and Metrology METROLOGY

24 Nov: XRD

 

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L5 Characterization_Bruker_SPM_E6-05-08A (Demo)
By Characterisation Characterisation and Metrology METROLOGY

24 Nov: SPM

 

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L5 DL Raman Microscope and PL (Demo)
By DL Metrology & Test METROLOGY Metrology & Test

24 Nov: Raman Microscope

 

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Regulus 8100
By Cleanrooms L1 CR METROLOGY

24 Nov: FE-SEM (Ultra High Resolution) – Cleanroom

 

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Hitachi Regulus 8230
By DL Metrology & Test METROLOGY

24 Nov: FE-SEM (Ultra High Resolution) – Dry Lab

 

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L3 Tescan FIB-SEM (Demo)
By DL Metrology & Test METROLOGY Metrology & Test

24 Nov: FIB-SEM

 

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E6NanoFab

  • 6601 8522 | 6601 6048
  • e6nanofab@nus.edu.sg
Office Address

Block E6, Level 5, E6-05-03
5 Engineering Drive 1, Singapore 117608

Mailing Address

c/o Department of Electrical and Computer Engineering
4 Engineering Drive 3, Block E4, # E4-5-42 Singapore 117583