METROLOGY – E6NANOFAB

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20180227_XRD L5 (Demo)

By Characterisation Characterisation and Metrology METROLOGY

X-ray Diffractometer (XRD) – Rigaku SmartLab

L5 Characterization_Bruker_SPM_E6-05-08A (Demo)

By Characterisation Characterisation and Metrology METROLOGY

Surface Profiler – Bruker DektakXT

L5 DL Raman Microscope and PL (Demo)

By DL Metrology & Test METROLOGY Metrology & Test

Raman Microscope – Renishaw inVia

JEOL-JSM-6700F-300x227 (Demo)

By DL Metrology & Test METROLOGY

Field Emission Scanning Electron Microscope – Hitachi Regulus 8100

Hitachi Regulus 8230

By DL Metrology & Test METROLOGY

Field Emission Scanning Electron Microscope (FE-SEM) – Hitachi Regulus 8230

L3 Tescan FIB-SEM (Demo)

By DL Metrology & Test METROLOGY Metrology & Test

Focused Ion Beam Scanning Electron Microscope (FIB-SEM) – Tescan GAIA3

Regulus 8100

By Cleanrooms L1 CR METROLOGY

Field Emission Scanning Electron Microscope (FE-SEM) – Hitachi Regulus 8100