METROLOGY – E6NANOFAB

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20180227_XRD L5 (Demo)

By Characterisation Characterisation and Metrology METROLOGY

XRD

L5 Characterization_Bruker_SPM_E6-05-08A (Demo)

By Characterisation Characterisation and Metrology METROLOGY

SPM

L5 DL Raman Microscope and PL (Demo)

By DL Metrology & Test METROLOGY Metrology & Test

Raman Microscope – Renishaw inVia

JEOL-JSM-6700F-300x227 (Demo)

By DL Metrology & Test METROLOGY

Field Emission Scanning Electron Microscope – Hitachi Regulus 8100

Hitachi Regulus 8230

By DL Metrology & Test METROLOGY

FE-SEM (Ultra High Resolution) – Dry Lab

L3 Tescan FIB-SEM (Demo)

By DL Metrology & Test METROLOGY Metrology & Test

FIB-SEM

Regulus 8100

By Cleanrooms L1 CR METROLOGY

FE-SEM (Ultra High Resolution) – Cleanroom