By DL Metrology & Test METROLOGY Field Emission Scanning Electron Microscope (FE-SEM) – Hitachi Regulus 8230
By DL Metrology & Test METROLOGY Metrology & Test Focused Ion Beam Scanning Electron Microscope (FIB-SEM) – Tescan GAIA3
By Characterisation and Metrology Cleanrooms DL Metrology & Test L1 CR MATERIAL CHARACTERIZATION AND PROCESS CONTROL Fourier Transform Infrared (FTIR) Spectrometer – Thermo Fisher Nicolet iS50