- Deposition and Growth
- Annealing Process
- Magnetic Processing
- Lithography
- Etching
- BEOL and Packaging
- Characterisation and Metrology
- Atomic Force/Scanning Probe Microscopy (AFM/SPM) – Park NX20
- Ellipsometer – Semilab SE-2000
- Field Emission Scanning Electron Microscope (FE-SEM) – Hitachi Regulus 8100
- Field Emission Scanning Electron Microscope (FE-SEM) – Hitachi Regulus 8230
- Focused Ion Beam Scanning Electron Microscope (FIB-SEM) – Tescan GAIA3
- Raman Microscope – Renishaw inVia
- Scanning Magneto-Optical Kerr Effect (SMOKE) Microscope – Evico Magnetics
- Surface Profiler – Bruker DektakXT
- Superconducting Quantum Interfernce Device (SQUID) Magnetometer – Quantum Design MPMS3
- Vibrating Sample Magnetometer (VSM) – MicroSense EZ9
- X-ray Diffractometer (XRD) – Rigaku SmartLab
- Others
- Tool Booking








