Facilities
Equipment Name / Service Description |
Equipment Location | MSE Internal Charge Rate (run by user) |
NUS Internal Charge rate (run by user) | NUS Internal Charge Rate (run by LO) |
Outside NUS Charge Rate (run by LO) |
Contact Person |
|
---|---|---|---|---|---|---|---|
 |  | $/hr | $/hr | $/hr | $/hr |  | |
TEM JEOL 3010F | Blk E4 #02-02 |
50 (excluding consumables) |
100 (excluding consumables) |
300 (excluding consumables) |
450 | Yang Fengzhen | mseyf@nus.edu.sg |
TEM JEOL 2800 | Blk E7 Level 1 |
70 (excluding consumables) |
150 (excluding consumables) |
300 (excluding consumables) |
500 | Yang Fengzhen | mseyf@nus.edu.sg |
TEM JEOL 2010F | Blk E4 #02-02 |
50 (excluding consumables) |
100 (excluding consumables) |
300 (excluding consumables |
500 | Yang Fengzhen | mseyf@nus.edu.sg |
Raman Spectrometer, Horiba Labram | Blk E3A #05-08 |
25 | 80 | 120 | 200 | Serene Chooi | mseckms@nus.edu.sg |
Scanning Electron Microscope (SEM); Zeiss Supra 40 | Blk E3A #05-12 |
40 | 90 | 180 | 220 | Shen Jingjing | shenjj2@nus.edu.sg |
High Temperature Furnaces |
Blk E3A #05-04 |
15 (or 40/day) | 40 | 40 | Not available | Alaric Wong | alaricw@nus.edu.sg |
Malvern ZetaSizer Nano | Blk E3A #05-11 |
15 | 40 | 60 | 150 per sample | Shen Jingjing | shenjj2@nus.edu.sg |
Micromeritics ASAP Surface Area and Porosity Analyzer |
Blk E3A #05-15 |
75/day | 300/day | 800/day | 1400 per day | Shen Jingjing | shenjj2@nus.edu.sg |
Powder XRD, Bruker D8 Advance | Blk E3A #05-15 |
35 | 120 | 160 | 180 | Chen Qun | msechenq@nus.edu.sg |
Thin Film XRD, Bruker D8 Advance | Blk E3A #05-15 |
35 | 120 | 160 | 180 | Chen Qun | msechenq@nus.edu.sg |
Non ambient temperature Powder XRD, PANalytical X'Pert PRO |
Blk E3A #05-15 |
40 | 120 | 180 | 220 | Chen Qun | msechenq@nus.edu.sg |
High resolution XRD; Bruker D8 Discover | Blk E3A #05-15 |
35 | 120 | 160 | 180 | Chen Qun | msechenq@nus.edu.sg |
Small-angle X-ray scattering system (SAXS), Xenocs 2.0 | Blk E3A #05-15 |
40 | 120 | 160 | 200 | Chen Qun | msechenq@nus.edu.sg |
Step profiler KLA Tencor Alpha-Step IQ (step height measurement only) | Blk E3A #05-10 |
10 | 25 | 40 | 50 per hr + 30 per sample |
Henche Kuan | msehk@nus.edu.sg |
Vibrating-sample magnetometer (VSM), Lake Shore 7407 | Blk E3A 05-01 |
60 | 90 | 120 | 150 | Chen Qun | msechenq@nus.edu.sg |
Hall Effect Measurement System | Blk E3A #05-07 |
30 | 90 | 120 | 150 | Chen Qun | msechenq@nus.edu.sg |
Polarizing Microscope w Heating Stage | Blk E3A #05-07 |
15 | 30 | 50 | 80 | Chen Qun | msechenq@nus.edu.sg |
DSC (Differential Scanning Calorimetry) TA Instruments DSC 25 | Blk E3A #05-07 |
15 (excluding consumables) |
40 (excluding consumables) |
60 (excluding consumables) |
80 per hr + 80 per sample |
Henche Kuan | msehk@nus.edu.sg |
TGA (Thermogravimetry Analysis) TA Instruments TGA Q500 |
Blk E3A #05-07 |
15 (excluding consumables) |
40 (excluding consumables) |
60 (excluding consumables) |
80 per hr + 80 per sample |
Henche Kuan | msehk@nus.edu.sg |
STA (Simultaneous Thermal Analysis) Setaram SETLINE STA | Blk E3A #05-07 |
10 (excluding consumables) |
30 (excluding consumables) |
40 (excluding consumables) |
60 per hr + 80 per sample |
Henche Kuan | msehk@nus.edu.sg |
UV-VIS-NIR spectrometer Agilent Cary 5000 | Blk E3A #05-10 |
30 (excluding consumables) |
30 (excluding consumables) |
40 (excluding consumables) |
60 per hr + 80 per sample |
Henche Kuan | msehk@nus.edu.sg |
UV-Vis spectrometer Shimadzu UV-1800 | Blk E3A #05-10 |
20 (excluding consumables) |
35 (excluding consumables) |
50 (excluding consumables) |
50 per hr + 60 per sample |
Henche Kuan | msehk@nus.edu.sg |
FTIR spectrometer Perkin-Elmer Spectrum Two |
Blk E3A #05-10 | 15 (excluding consumables) |
30 (excluding consumables) |
40 (excluding consumables) |
60 per hr + 80 per sample | Henche Kuan | msehk@nus.edu.sg |
Fluorescence spectrometer Perkin-Elmer FL-6500 |
Blk E3A #05-11 | 15 (excluding consumables) |
30 (excluding consumables) |
40 (excluding consumables) |
60 per hr + 80 per sample | Henche Kuan | msehk@nus.edu.sg |
UV-VIS-NIR spectrometer Agilent Cary 5000 | Blk E3A #05-10 | 15 (excluding consumables) |
30 (excluding consumables) |
40 (excluding consumables) |
60 per hr + 80 per sample | Henche Kuan | msehk@nus.edu.sg |
UV-Vis spectrometer Shimadzu UV-1800 | Blk E3A #05-10 | 10 (excluding consumables) |
25 (excluding consumables) |
40 (excluding consumables) |
50 per hr + 60 per sample | Henche Kuan | msehk@nus.edu.sg |
dSC (Differential Scanning Calorimetry) TA Instruments DSC 25 | Blk E3A #05-10 | 15 (excluding consumables) |
40 (excluding consumables) |
50 (excluding consumables) |
70 per hr + 80 per sample | Henche Kuan | msehk@nus.edu.sg |
FTIR spectrometer Agilent Cary 660 | Blk E3A #05-10 |
30 | 40 | 60 | 60 per hr + 100 per sample |
Henche Kuan | msehk@nus.edu.sg |
XPS/UPS (X- ray/Ultraviolet Photoelectron Spectroscopy) Kratos Axis Ultra DLD |
Blk E3A #05-13 |
Not Available | Not Available | Not Available | Not Available | Henche Kuan | msehk@nus.edu.sg |
Four-point Probe | Blk E3A #05-07 |
10 (excluding consumables) |
20 (excluding consumables) |
30 (excluding consumables) |
40 per hr + 40 per sample |
Chan Yew Weng | msecyw@nus.edu.sg |
Universal Testing Machine, Lloyd | Blk E3A #05-07 |
10 | 30 | 45 | 150 | Chan Yew Weng | msecyw@nus.edu.sg |
Polishing Machine | Blk E3A #05-02 |
5 | 15 | 45 | 150 | Chan Yew Weng | msecyw@nus.edu.sg |
Metallurigical Microscope | Blk E3A #05-02 |
10 | 20 | 45 | 150 | Henche Kuan | msehk@nus.edu.sg |
Hardness Tester, Indentec |
Blk E3A #05-07 |
10 | 30 | 50 | 60 per sample | Chan Yew Weng | msecyw@nus.edu.sg |