Facilities

Equipment Name /
Service Description		 Equipment Location MSE Internal
Charge Rate
(run by user)		 NUS Internal Charge rate (run by user) NUS Internal
Charge Rate
(run by LO) 		Outside NUS
Charge Rate
(run by LO)		 Contact
Person		 Email
    $/hr $/hr $/hr $/hr  
TEM JEOL 3010F Blk E4
#02-02		 100
(excluding consumables)		 160
(excluding consumables)		 250
(excluding consumables)		 450 Yang Fengzhen mseyf@nus.edu.sg
TEM JEOL 2010F Blk E4
#02-02		 140
(excluding consumables)		 220
(excluding consumables)		 300
(excluding consumables		 500 Yang Fengzhen mseyf@nus.edu.sg
Raman Spectrometer, Horiba Labram Blk E3A
#05-08		 45 80 120 200 Serene Chooi mseckms@nus.edu.sg
Scanning Electron Microscope (SEM); Zeiss Supra 40 Blk E3A
#05-12		 100 140 180 220 Shen Jingjing shenjj2@nus.edu.sg
High Temperature
Furnaces		 Blk E3A
#05-04		 30 40 40 Not available Alaric Wong alaricw@nus.edu.sg
Malvern ZetaSizer Nano Blk E3A
#05-11		 30 40 60 150 per sample He Jian msehj@nus.edu.sg
Micromeritics ASAP
Surface Area and
Porosity Analyzer		 Blk E3A
#05-15		 150/day 300/day 800/day 1400 per day Shen Jingjing shenjj2@nus.edu.sg
Powder XRD, Bruker D8 Advance Blk E3A
#05-15		 75 120 160 180 Chen Qun msechenq@nus.edu.sg
Thin Film XRD, Bruker D8 Advance Blk E3A
#05-15		 75 120 160 180 Chen Qun msechenq@nus.edu.sg
Non ambient temperature Powder XRD, PANalytical
X'Pert PRO		 Blk E3A
#05-15		 75 120 180 220 Chen Qun msechenq@nus.edu.sg
High resolution XRD; Bruker D8 Discover Blk E3A
#05-15		 75 120 160 180 Chen Qun msechenq@nus.edu.sg
Small-angle X-ray scattering system (SAXS), Xenocs 2.0 Blk E3A
#05-15		 75 120 160 200 Chen Qun msechenq@nus.edu.sg
Vibrating-sample magnetometer (VSM), Lake Shore 7407 Blk E3A
05-01		 60 90 120 150 Chen Qun msechenq@nus.edu.sg
Hall Effect Measurement System Blk E3A
#05-07		 60 90 120 150 Chen Qun msechenq@nus.edu.sg
Polarizing Microscope w Heating Stage Blk E3A
#05-07		 30 40 50 80 Chen Qun msechenq@nus.edu.sg
DSC (Differential Scanning Calorimetry) TA Instruments DSC 25 Blk E3A
#05-07		 30
(excluding consumables)		 50
(excluding consumables)		 80
(excluding consumables)		 80 per hr +
80 per sample		 Henche Kuan msehk@nus.edu.sg
TGA (Thermogravimetry Analysis)
TA Instruments TGA Q500		 Blk E3A
#05-07		 30
(excluding consumables)		 50
(excluding consumables)		 80
(excluding consumables)		 80 per hr +
80 per sample		 Henche Kuan msehk@nus.edu.sg
STA (Simultaneous Thermal Analysis) Setaram SETLINE STA Blk E3A
#05-07		 20
(excluding consumables)		 30
(excluding consumables)		 40
(excluding consumables)		 40 per hr +
80 per sample		 Henche Kuan msehk@nus.edu.sg
Step profiler KLA Tencor Alpha-Step IQ (step height measurement only) Blk E3A
#05-10		 15 25 40 50 per hr +
30 per sample		 Henche Kuan msehk@nus.edu.sg
UV-VIS-NIR spectrometer Agilent Cary 5000 Blk E3A
#05-10		 30
(excluding consumables)		 30
(excluding consumables)		 40
(excluding consumables)		 60 per hr +
80 per sample		 Henche Kuan msehk@nus.edu.sg
UV-Vis spectrometer Shimadzu UV-1800 Blk E3A
#05-10		 20
(excluding consumables)		 35
(excluding consumables)		 50
(excluding consumables)		 50 per hr +
60 per sample		 Henche Kuan msehk@nus.edu.sg
FTIR spectrometer Agilent Cary 660 Blk E3A
#05-10		 30 40 60 60 per hr +
100 per sample		 Henche Kuan msehk@nus.edu.sg
XPS/UPS (X- ray/Ultraviolet Photoelectron Spectroscopy)
Kratos Axis Ultra DLD		 Blk E3A
#05-13		 150 190 240 400 Henche Kuan msehk@nus.edu.sg
Four-point Probe Blk E3A
#05-07		 15
(excluding consumables)		 20
(excluding consumables)		 20
(excluding consumables)		 40 per hr +
40 per sample		 Chan Yew Weng msecyw@nus.edu.sg
Universal Testing Machine, Lloyd Blk E3A
#05-07		 15 30 45 200 Chan Yew Weng msecyw@nus.edu.sg
Polishing Machine Blk E3A
#05-02		 15 30 45 150 Chan Yew Weng msecyw@nus.edu.sg
Metallurigical Microscope Blk E3A
#05-02		 15 30 45 150 Henche Kuan msehk@nus.edu.sg
Hardness Tester,
Indentec		 Blk E3A
#05-07		 20 40 60 60 per sample Chan Yew Weng msecyw@nus.edu.sg