Facilities
Advanced Materials Characterization:
The state-of-the-art research facilities in the Department of Materials Science and Engineering enable comprehensive material analysis, ranging from atomic ordering and precise chemical composition to thermal, optical, mechanical, structural, and electronic properties, as well as detailed microstructural characterization at the atomic level.
STEM:
The highest-resolution microscopy technique. It can image and generate elemental maps at atomic resolution, using a focused <0.1 nm electron beam that scans across a thin sample.
FIB:
Used for making cross-sectional samples. An electron beam and ion beam are combined in one instrument, with the focused ion beam able to very locally sputter (remove) material, exposing the underlaying layers.
HRTEM:
Transmission electron microscopes are used for imaging materials at almost atomic resolution. TEMs can also image electron diffraction patterns, to precisely measure the local atomic structure of a material.
SEM:
The Scanning Electron Microscope uses a gentle electron beam to precisely image the top surface of a material, and to map the local elemental composition.
XRD:
X-ray diffraction is the most accurate technique for learning about the way atoms are ordered in materials: are they amorphous or crystalline, and how exactly are the atoms ordered in the crystals?
SAXS:
X-ray diffraction with a wide field of view. Can accurately measure the atomic ordering of non-powder samples with large crystals, and of particle suspensions.
| Equipment Name / Service Description |
Equipment Location | MSE Internal Charge Rate (run by user) |
NUS Internal Charge Rate (run by user) |
NUS Internal Charge Rate (run by LO) |
Outside NUS Charge Rate (run by LO) |
Contact Person |
|
|---|---|---|---|---|---|---|---|
| $/hr | $/hr | $/hr | $/hr | ||||
| TEM JEOL 3010F(opens in new tab) | Blk E4 #02-02 |
50 (excluding consumables) |
100 (excluding consumables) |
300 (excluding consumables) |
450 | Yang Fengzhen | mseyf@nus.edu.sg |
| TEM JEOL 2800 | Blk E7 Level 1 |
70 (excluding consumables) |
150 (excluding consumables) |
300 (excluding consumables) |
500 | Yang Fengzhen | mseyf@nus.edu.sg |
| TEM JEOL 2010F(opens in new tab) | Blk E4 #02-02 |
50 (excluding consumables) |
100 (excluding consumables) |
300 (excluding consumables |
500 | Yang Fengzhen | mseyf@nus.edu.sg |
| Raman Spectrometer, Horiba Labram(opens in new tab) | Blk E3A #05-08 |
25 | 80 | 120 | 200 | Serene Chooi | mseckms@nus.edu.sg |
| Scanning Electron Microscope (SEM); Zeiss Sigma 300(opens in new tab) | Blk E3A #05-11A |
40 | 90 | 180 | 220 | Shen Jingjing | shenjj2@nus.edu.sg |
| SEM JEOL JSM-IT800SHL(opens in new tab) | Blk E3A #05-11A |
50 | 100 | 220 | 280 | Shen Jingjing | shenjj2@nus.edu.sg |
| High Temperature Furnaces |
Blk E3A #05-04 |
15 (or 40/day) | 40 | 40 | Not available | Chen Qun | msechenq@nus.edu.sg |
| Malvern ZetaSizer Nano(opens in new tab) | Blk E3A #05-10 |
15 | 40 | 60 | 150 per sample | Chen Qun | msechenq@nus.edu.sg |
| Micromeritics ASAP Surface Area and Porosity Analyzer(opens in new tab) |
Blk E3A #05-10 |
75/day | 300/day | 800/day | 1400 per day | Chen Qun | msechenq@nus.edu.sg |
| Powder XRD, Bruker D8 Advance(opens in new tab) | Blk E3A #05-15 |
35 | 120 | 160 | 180 | Chen Qun | msechenq@nus.edu.sg |
| Thin Film XRD, Bruker D8 Advance(opens in new tab) | Blk E3A #05-15 |
35 | 120 | 160 | 180 | Chen Qun | msechenq@nus.edu.sg |
| Non ambient temperature Powder XRD, PANalytical X'Pert PRO(opens in new tab) |
Blk E3A #05-15 |
40 | 120 | 180 | 220 | Chen Qun | msechenq@nus.edu.sg |
| High resolution XRD; Bruker D8 Discover(opens in new tab) | Blk E3A #05-15 |
35 | 120 | 160 | 180 | Chen Qun | msechenq@nus.edu.sg |
| Small-angle X-ray scattering system (SAXS), Xenocs 2.0 | Blk E3A #05-15 |
40 | 120 | 160 | 200 | Chen Qun | msechenq@nus.edu.sg |
| Step profiler KLA Tencor Alpha-Step IQ (step height measurement only)(opens in new tab) | Blk E3A #05-08 |
10 | 25 | 40 | 50 per hr + 30 per sample |
Henche Kuan | msehk@nus.edu.sg |
| Vibrating-sample magnetometer (VSM), Lake Shore 7407 | Blk E3A 05-01 |
60 | 90 | 120 | 150 | Chen Qun | msechenq@nus.edu.sg |
| Hall Effect Measurement System | Blk E3A #05-07 |
30 | 90 | 120 | 150 | Chen Qun | msechenq@nus.edu.sg |
| Polarizing Microscope w Heating Stage | Blk E3A #05-07 |
15 | 30 | 50 | 80 | Chen Qun | msechenq@nus.edu.sg |
| DSC (Differential Scanning Calorimetry) TA Instruments DSC 25(opens in new tab) | Blk E3A #05-08 |
15 (excluding consumables) |
40 (excluding consumables) |
60 (excluding consumables) |
80 per hr + 80 per sample |
Henche Kuan | msehk@nus.edu.sg |
| TGA (Thermogravimetry Analysis) TA Instruments TGA Q50 or Q500(opens in new tab) |
Blk E3A #05-08 |
15 (excluding consumables) |
40 (excluding consumables) |
60 (excluding consumables) |
80 per hr + 80 per sample |
Henche Kuan | msehk@nus.edu.sg |
| FTIR spectrometer(opens in new tab) Perkin-Elmer Spectrum Two(opens in new tab) |
Blk E3A #05-06 | 15 | 30 | 40 | 60 per hr + 80 per sample | Henche Kuan | msehk@nus.edu.sg |
| Fluorescence spectrometer(opens in new tab) Perkin-Elmer FL-6500(opens in new tab) |
Blk E3A #05-06 | 15 | 30 | 40 | 60 per hr + 80 per sample | Henche Kuan | msehk@nus.edu.sg |
| UV-VIS-NIR spectrometer Agilent Cary 5000 | Blk E3A #05-06 | 15 | 30 | 40 | 60 per hr + 80 per sample | Henche Kuan | msehk@nus.edu.sg |
| UV-Vis spectrometer Shimadzu UV-1900(opens in new tab) | Blk E3A #05-06 | 10 | 25 | 40 | 50 per hr + 60 per sample | Henche Kuan | msehk@nus.edu.sg |
| FTIR spectrometer Agilent Cary 660(opens in new tab) | Blk E3A #05-06 | 15 | 30 | 40 | 60 per hr + 100 per sample |
Henche Kuan | msehk@nus.edu.sg |
| Stylus profilometer Bruker Dektak-XT(opens in new tab) | Blk E3A #05-08 | 10 | 25 | 40 | 50 per hr + 30 per sample | Henche Kuan | msehk@nus.edu.sg |
| UV-Vis spectrometer with integrating sphere Shimadzu UV-2600i(opens in new tab) | Blk E3A #05-06 | 15 | 30 | 40 | 60 per hr + 80 per sample | Henche Kuan | msehk@nus.edu.sg |
| Four-point Probe(opens in new tab) | Blk E3A #05-07 |
10 (excluding consumables) |
20 (excluding consumables) |
30 (excluding consumables) |
40 per hr + 40 per sample |
Chan Yew Weng | msecyw@nus.edu.sg |
| Universal Testing Machine, Lloyd(opens in new tab) | Blk E3A #05-07 |
10 | 30 | 45 | 150 | Chan Yew Weng | msecyw@nus.edu.sg |
| Polishing Machine(opens in new tab) | Blk E3A #05-02 |
5 | 15 | 45 | 150 | Chan Yew Weng | msecyw@nus.edu.sg |
| Metallurigical Microscope(opens in new tab) | Blk E3A #05-02 |
10 | 20 | 45 | 150 | Henche Kuan | msehk@nus.edu.sg |
| Hardness Tester, Indentec(opens in new tab) |
Blk E3A #05-07 |
10 | 30 | 50 | 60 per sample | Chan Yew Weng | msecyw@nus.edu.sg |
| Digital Light Processing Printer (microArch S140) | Blk E3A #05-16 |
30
|
60
|
Dr. Manohar Salla | msems@nus.edu.sg(opens in new tab) | ||
| Digital Light Processing Printer (MicroSLA Micro 2-5um) |
Blk E3A #05-16 |
20
|
40
|
Dr. Manohar Salla | msems@nus.edu.sg(opens in new tab) | ||
| FDM (Fused Deposition Modelling) printer (Bambu Lab, X1C) |
Blk E3A #05-16 |
12
|
24
|
Dr. Manohar Salla | msems@nus.edu.sg(opens in new tab) | ||
| Anton Parr Modular Compact Rheometer (MCR302e) | Blk E3A #05-10 |
30 | 60 | Shen Jingjing | shenjj2@nus.edu.sg | ||
| Femtosecond Laser Micro Machining System FreeDo F5 | Blk E3A #05-16 |
50
|
100
|
Dr. Manohar Salla | msems@nus.edu.sg(opens in new tab) | ||
| MIRA 7 Laser Cutting Machine & Filter Fume Extractor (YC3109) | Blk E3A #05-16 |
20 | 40 | Dr. Manohar Salla | msems@nus.edu.sg(opens in new tab) | ||
| Mastersizer | Blk E3A #05-10 |
15
|
40
|
60
|
150
|
Chan Yew Weng | msecyw@nus.edu.sg |
| iCAP Pro ICP-OES (Inductively Coupled Plasma Optical Emission Spectroscopy) | Blk E3A #05-10 |
30
|
60
|
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|
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|
Shen Jingjing | shenjj2@nus.edu.sg |
|
Ultrasonic Coating System
(SONO-TEK Exacta.Coat)
|
Blk E3A #05-15 |
35 | 70 |
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|
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|
Dr. Manohar Salla | msems@nus.edu.sg(opens in new tab) |
|
Wire bonder
(tpt-HB16)
|
Blk E3A
#03-09A |
15
|
40
|
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|
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|
Dr. Manohar Salla
|
msems@nus.edu.sg(opens in new tab) |
| X-ray Absorption Fine Structure (XAFS) Spectrometer |
Blk E3A
#05-12A |
25
|
50
|
125
|
200
|
Chen Qun
|
msechenq@nus.edu.sg |
| Electromagnet with Probe System (2.5K-300K, 0.7 T) |
Blk E3A
#03-09A
|
150/per day
|
360/per day
|
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|
500/per day
(run by user) |
Dr. Manohar Salla | msems@nus.edu.sg(opens in new tab) |