Fluorine Engineering for BEOL Oxide Semiconductor Transistors: From Wide-Temperature Reliability to Threshold-Voltage Control and High-Gain Logic

Mr Chen Xuanqi
Graduate Student, ECE Dept, NUS

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Event Details

Date & Time

2 September 2026, Wednesday
10:00 AM - 10:30 AM

Venue

https://nus-sg.zoom.us/j/89181089382?pwd=FLb00wT93Nl5uCJRuufcKlqTYIdSn1.1

Organiser

Dr Liu Gan