Events July 2026MonTueWedThuFriSatSun 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 Select CategoryYear:Select Year20192020202120222023202420252026Month:Select MonthJanuaryFebruaryMarchAprilMayJuneJulyAugustSeptemberOctoberNovemberDecember 02Jul 2026Towards Trustworthy Learning-Based Spacecraft Attitude Control for On-Orbit Servicing MissionTime & Date:2 July 2026, Thursday / 16:00 PM - 17:00 PMVenue:E5-03-2013Jul 2026Fast, Accurate, and Reliable Electromagnetic Compatibility Design for Integrated CircuitsTime & Date:13 July 2026, Monday / 10:30 AM - 11:30 AMVenue:E3-06-0113Jul 2026Auditing Dormant-Expert Backdoors in Mixture-of-Experts LLMs: A Reference-Free, Architecture-Agnostic Cumulative-Kill CliffTime & Date:13 July 2026, Monday / 13:00 PM - 13:30 PMVenue:E4-05-39 - ECE Conference Room14Jul 2026Germanium Photodetectors with >100 GHz Bandwidth and >1.1 A/W Responsivity on 200-mm Silicon Photonics PlatformTime & Date:14 July 2026, Tuesday / 10:30 AM - 11:00 AMVenue:https://nus-sg.zoom.us/j/3391485944?pwd=jJiZafaU9UjMqtCAJUbv0GMk4nDt9c.1&omn=8142340635615Jul 2026An Introspective on Statistical Pattern Recognition in the Age of Generative AITime & Date:15 July 2026, Wednesday / 10:00 AM - 11:00 AMVenue:E4-04-0315Jul 2026Algorithmic Trading with Large-Scale Deep LearningTime & Date:15 July 2026, Wednesday / 15:00 PM - 16:00 PMVenue:E4-04-0317Jul 2026Neuromotor Hierarchy Network: A Physiologically Grounded Encoder for Generalizable sEMG DecodingTime & Date:17 July 2026, Friday / 16:00 PM - 17:00 PMVenue:https://nus-sg.zoom.us/j/88028075281?pwd=gyy1QDJp4aHYN3r1bFunSIKhjveg4h.120Jul 2026Design for Manufacturing in RF CMOS Learning from a System-Level N-Varactor FailureTime & Date:20 July 2026, Monday / 15:00 PM - 15:30 PMVenue:https://nus-sg.zoom.us/j/82640637707?pwd=DFBlNamK0GicLl3oG6auKByTB3nE1z.120Jul 2026Digital Twin Framework for Safety-Critical 360-degree Video Streaming in Autonomous VehiclesTime & Date:20 July 2026, Monday / 14:00 PM - 15:00 PMVenue:E4-05-39 - ECE Conference Room22Jul 2026Designing Clean Metal Etch and FOUP Handling for SRAM Yield: A Case Study on Via Bottom Void FailuresTime & Date:22 July 2026, Wednesday / 15:00 PM - 15:30 PMVenue:https://nus-sg.zoom.us/j/83103448185?pwd=g4yik00d58ooOM3lXa4YryPfa8Qsnf.124Jul 2026A Novel Method to Manufacture Multi-Layer High Density CapacitorTime & Date:24 July 2026, Friday / 15:00 PM - 15:30 PMVenue:https://nus-sg.zoom.us/j/82669667058?pwd=SQNRaxOvluaRN5vf3NyDPTAJCH2ghg.129Jul 2026Computation-enabled Light-field DetectionTime & Date:29 July 2026, Wednesday / 15:00 PM - 16:00 PMVenue:E5-03-20
